Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12040312 | Semiconductor package structure and method for manufacturing the same | Chien-Wei Chang, Shang-Wei Yeh, Min-Lung Huang | 2024-07-16 |
| 11424212 | Semiconductor package structure and method for manufacturing the same | Chien-Wei Chang, Shang-Wei Yeh, Min-Lung Huang | 2022-08-23 |
| 9960102 | Semiconductor devices and methods of manufacturing the same | Min-Lung Huang | 2018-05-01 |
| 9947635 | Semiconductor package, interposer and semiconductor process for manufacturing the same | Wen-Long LU, Yuan-Feng Chiang, Chi-Chang Lee | 2018-04-17 |
| 9362185 | Uniformity in wafer patterning using feedback control | Han-Wen Liao, Chih-Yu Lin, Cherng-Chang Tsuei | 2016-06-07 |
| 9064741 | Uniformity in wafer patterning using feedback control | Han-Wen Liao, Chih-Yu Lin, Cherng-Chang Tsuei | 2015-06-23 |
| 8937015 | Method for forming vias in a substrate | Meng-Jen Wang | 2015-01-20 |
| 8390129 | Semiconductor device with a plurality of mark through substrate vias | Chi-Chih Shen, Jen-Chuan Chen, Hui-Shan Chang, Meng-Jen Wang | 2013-03-05 |
| 7859645 | Masks and methods of manufacture thereof | Uwe Schroeder | 2010-12-28 |
| 7648805 | Masks and methods of manufacture thereof | Uwe Schroeder | 2010-01-19 |
| 7407736 | Methods of improving single layer resist patterning scheme | Kuang-Jung Chen, Wu-Song Huang | 2008-08-05 |
| 7074525 | Critical dimension control of printed features using non-printing fill patterns | Timothy A. Brunner, Shahid Butt, Patrick Speno | 2006-07-11 |
| 6861209 | Method to enhance resolution of a chemically amplified photoresist | Waikin Li | 2005-03-01 |