Issued Patents All Time
Showing 26–50 of 53 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8642407 | Devices having reduced susceptibility to soft-error effects and method for fabrication | Tak H. Ning | 2014-02-04 |
| 8541814 | Minimizing leakage current and junction capacitance in CMOS transistors by utilizing dielectric spacers | Dureseti Chidambarrao, Ramachandran Muralidhar, Viorel Ontalus | 2013-09-24 |
| 8492852 | Interface structure for channel mobility improvement in high-k metal gate stack | Tze-Chiang Chen, Dechao Guo, Yanfeng Wang | 2013-07-23 |
| 8361847 | Stressed channel FET with source/drain buffers | Jeffrey B. Johnson, Ramachandran Muralidhar, Viorel Ontalus, Kai Xiu | 2013-01-29 |
| 8354858 | Apparatus and method for hardening latches in SOI CMOS devices | Ethan H. Cannon, AJ KleinOsowski, K. Paul Muller, Tak H. Ning, Leon Sigal +2 more | 2013-01-15 |
| 8354720 | Embedded stressor for semiconductor structures | Dechao Guo, Shu-Jen Han, Pranita Kulkarni | 2013-01-15 |
| 8338258 | Embedded stressor for semiconductor structures | Dechao Guo, Shu-Jen Han, Pranita Kulkarni | 2012-12-25 |
| 8304301 | Implant free extremely thin semiconductor devices | Kangguo Cheng, Bruce B. Doris, Dechao Guo, Pranita Kulkarni, Ghavam G. Shahidi | 2012-11-06 |
| 8288217 | Stressor in planar field effect transistor device | Dechao Guo, Pranita Kulkarni, Alexander Reznicek, Keith Kwong Hon Wong | 2012-10-16 |
| 8053317 | Method and structure for improving uniformity of passive devices in metal gate technology | Satya N. Chakravarti, Dechao Guo, Wilfried E. Haensch, Pranita Kulkarni, Fei Liu +1 more | 2011-11-08 |
| 7923782 | Hybrid SOI/bulk semiconductor transistors | Huilong Zhu, Bruce B. Doris, Xinlin Wang, Oleg Gluschenkov, Huajie Chen +1 more | 2011-04-12 |
| 7888959 | Apparatus and method for hardening latches in SOI CMOS devices | Ethan H. Cannon, AJ KleinOsowski, K. Paul Muller, Tak H. Ning, Leon Sigal +2 more | 2011-02-15 |
| 7883944 | Ultra-thin semiconductor on insulator metal gate complementary field effect transistor with metal gate and method of forming thereof | Huilong Zhu, Bruce B. Doris | 2011-02-08 |
| 7791169 | Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors | John M. Aitken, Ethan H. Cannon, Alvin W. Strong | 2010-09-07 |
| 7785944 | Method of making double-gated self-aligned finFET having gates of different lengths | Huilong Zhu, Bruce B. Doris, Xinlin Wang, Jochen Beintner, Ying Zhang | 2010-08-31 |
| 7776725 | Anti-halo compensation | Huilong Zhu, Cheruvu Murthy | 2010-08-17 |
| 7767503 | Hybrid SOI/bulk semiconductor transistors | Huilong Zhu, Bruce B. Doris, Xinlin Wang, Oleg Gluschenkov, Huajie Chen +1 more | 2010-08-03 |
| 7691482 | Structure for planar SOI substrate with multiple orientations | Huilong Zhu, Bruce B. Doris, Meikei Ieong, Min Yang | 2010-04-06 |
| 7627840 | Method for soft error modeling with double current pulse | A J Kleinosowski, Paul M. Solomon, Richard Q. Williams | 2009-12-01 |
| 7452761 | Hybrid SOI-bulk semiconductor transistors | Huilong Zhu, Bruce B. Doris, Xinlin Wang, Oleg Gluschenkov, Huajie Chen +1 more | 2008-11-18 |
| 7388274 | Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors | John M. Aitken, Ethan H. Cannon, Alvin W. Strong | 2008-06-17 |
| 7365378 | MOSFET structure with ultra-low K spacer | Elbert E. Huang, Ghavam G. Shahidi, Christy S. Tyberg, Xinlin Wang, Robert L. Wisnieff | 2008-04-29 |
| 7348641 | Structure and method of making double-gated self-aligned finFET having gates of different lengths | Huilong Zhu, Bruce B. Doris, Xinlin Wang, Jochen Beintner, Ying Zhang | 2008-03-25 |
| 7315075 | Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors | John M. Aitken, Ethan H. Cannon, Alvin W. Strong | 2008-01-01 |
| 7220626 | Structure and method for manufacturing planar strained Si/SiGe substrate with multiple orientations and different stress levels | Huilong Zhu, Bruce B. Doris, Meikei Ieong, Min Yang, Huajie Chen | 2007-05-22 |