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Satya N. Chakravarti

IBM: 19 patents #5,782 of 70,183Top 9%
FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
Infineon Technologies Ag: 1 patents #4,439 of 7,486Top 60%
📍 Troy, NY: #26 of 610 inventorsTop 5%
🗺 New York: #7,406 of 115,490 inventorsTop 7%
Overall (All Time): #239,906 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDate
9059006 Replacement-gate-compatible programmable electrical antifuse Dechao Guo, Chuck T. Le, Byoung W. Min, Thekkemadathil V. Rajeevakumar, Keith Kwong Hon Wong 2015-06-16
8680651 Nanopillar decoupling capacitor Dechao Guo, Huiming Bu, Keith Kwong Hon Wong 2014-03-25
8441039 Nanopillar E-fuse structure and process Dechao Guo, Huiming Bu, Keith Kwong Hon Wong 2013-05-14
8344428 Nanopillar E-fuse structure and process Dechao Guo, Huiming Bu, Keith Kwong Hon Wong 2013-01-01
8258037 Nanopillar decoupling capacitor Dechao Guo, Huiming Bu, Keith Kwong Hon Wong 2012-09-04
8237457 Replacement-gate-compatible programmable electrical antifuse Dechao Guo, Chuck T. Le, Byoung W. Min, Thekkemadathil V. Rajeevakumar, Keith Kwong Hon Wong 2012-08-07
8097520 Integration of passive device structures with metal gate layers Huiming Bu, Dechao Guo, Keith Kwong Hon Wong 2012-01-17
8053317 Method and structure for improving uniformity of passive devices in metal gate technology Dechao Guo, Wilfried E. Haensch, Pranita Kulkarni, Fei Liu, Philip J. Oldiges +1 more 2011-11-08
7531886 MOSFET fuse programmed by electromigration Thekkemadathil V. Rajeevakumar, Timothy Sullivan 2009-05-12
7001844 Material for contact etch layer to enhance device performance Ashima B. Chakravarti, Shreesh Narasimha, Victor Chan, Judson R. Holt 2006-02-21
6528383 Simultaneous formation of deep trench capacitor and resistor Ashima B. Chakravarti, Irene McStay, Kwong Hon Wong 2003-03-04
6436760 Method for reducing surface oxide in polysilicon processing Kwong Hon Wong, Ashima B. Chakravarti, Subramanian S. Iyer 2002-08-20
6339228 DRAM cell buried strap leakage measurement structure and method Sundar Iyer, Subramanian S. Iyer 2002-01-15
6204112 Process for forming a high density semiconductor device Ashima B. Chakravarti, James G. Ryan 2001-03-20
5909044 Process for forming a high density semiconductor device Ashima B. Chakravarti, James G. Ryan 1999-06-01
4897154 Post dry-etch cleaning method for restoring wafer properties Stephen J. Fonash, Xiao-Chun Mu 1990-01-30
4542340 Testing method and structure for leakage current characterization in the manufacture of dynamic RAM cells Paul L. Garbarino, Donald A. Miller 1985-09-17
4300210 Calibrated sensing system Lawrence G. Heller, Wilbur D. Pricer 1981-11-10
4287571 High density transistor arrays John Andrew Hiltebeitel 1981-09-01