BM

Byoung W. Min

FS Freeescale Semiconductor: 24 patents #78 of 3,767Top 3%
HC Hyundai Heavy Industries Co.: 3 patents #13 of 220Top 6%
HC Hyundai Electric & Energy Systems Co.: 2 patents #1 of 47Top 3%
Motorola: 2 patents #4,475 of 12,470Top 40%
IBM: 2 patents #32,839 of 70,183Top 50%
Samsung: 2 patents #37,631 of 75,807Top 50%
GU Globalfoundries U.S.: 1 patents #344 of 665Top 55%
📍 Seojong-myeon, TX: #2 of 13 inventorsTop 20%
Overall (All Time): #98,119 of 4,157,543Top 3%
35
Patents All Time

Issued Patents All Time

Showing 1–25 of 35 patents

Patent #TitleCo-InventorsDate
11402340 Method for detecting defect in insulating material Joo-Eon Pakr 2022-08-02
11380373 Memory with read circuit for current-to-voltage slope characteristic-based sensing and method Mohamed A. Nour, Peter C. Paliwoda, Toshiaki Kirihata 2022-07-05
10145836 Apparatus for measuring dissolved gas and oil immersed transformer having the same Jung Han Kim, Byeong Ho Lee, Young Keun Hur 2018-12-04
9448286 Preventive diagnostic system for GIS based on IEC 61850 Jeong Bok Lee, Chang Sun Park 2016-09-20
9299856 Selective gate oxide properties adjustment using fluorine 2016-03-29
9279858 Cubicle type gas insulated switchgear monitoring and diagnosis system Chang Sun Park, Hyung Ryun Park, Yong-geun Kim 2016-03-08
9082650 Integrated split gate non-volatile memory cell and logic structure Asanga H. Perera, Cheong Min Hong, Sung-Taeg Kang, Jane A. Yater 2015-07-14
9059006 Replacement-gate-compatible programmable electrical antifuse Satya N. Chakravarti, Dechao Guo, Chuck T. Le, Thekkemadathil V. Rajeevakumar, Keith Kwong Hon Wong 2015-06-16
9057755 Device for monitoring internal arc in gas insulated switchgear Hyung Ryun Park, Chang Sun Park 2015-06-16
8975143 Selective gate oxide properties adjustment using fluorine 2015-03-10
8901632 Non-volatile memory (NVM) and high-K and metal gate integration using gate-last methodology Asanga H. Perera, Cheong Min Hong, Sung-Taeg Kang, Jane A. Yater 2014-12-02
8294239 Effective eFuse structure 2012-10-23
8237457 Replacement-gate-compatible programmable electrical antifuse Satya N. Chakravarti, Dechao Guo, Chuck T. Le, Thekkemadathil V. Rajeevakumar, Keith Kwong Hon Wong 2012-08-07
8088657 Integrated circuit using FinFETs and having a static random access memory (SRAM) James D. Burnett, Leo Mathew 2012-01-03
7927934 SOI semiconductor device with body contact and method thereof Dharmesh Jawarani 2011-04-19
7858505 Method of forming a transistor having multiple types of Schottky junctions 2010-12-28
7820530 Efficient body contact field effect transistor with reduced body resistance Stefan Zollner, Qingqing Liang 2010-10-26
7754560 Integrated circuit using FinFETs and having a static random access memory (SRAM) James D. Burnett, Leo Mathew 2010-07-13
7709303 Process for forming an electronic device including a fin-type structure James D. Burnett, Leo Mathew 2010-05-04
7648884 Semiconductor device with integrated resistive element and method of making James K. Schaeffer, David C. Sing 2010-01-19
7517742 Area diode formation in SOI application Laegu Kang, Michael G. Khazhinsky 2009-04-14
7452768 Multiple device types including an inverted-T channel transistor and method therefor James D. Burnett, Leo Mathew 2008-11-18
7410876 Methodology to reduce SOI floating-body effect Jon D. Cheek, Venkat R. Kolagunta 2008-08-12
7186596 Vertical diode formation in SOI application Laegu Kang, Michael G. Khazhinsky 2007-03-06
7144784 Method of forming a semiconductor device and structure thereof Nigel G. Cave, Venkat R. Kolagunta, Omar Zia, Sinan Goktepeli 2006-12-05