JW

Junli Wang

IBM: 418 patents #38 of 70,183Top 1%
Globalfoundries: 20 patents #152 of 4,424Top 4%
SS Stmicroelectronics Sa: 13 patents #86 of 1,676Top 6%
TE Tessera: 4 patents #104 of 271Top 40%
SO Sony: 4 patents #8,966 of 25,231Top 40%
AS Adeia Semiconductor Solutions: 2 patents #9 of 57Top 20%
EU East China Normal University: 1 patents #33 of 168Top 20%
📍 Slingerlands, NY: #1 of 96 inventorsTop 2%
🗺 New York: #26 of 115,490 inventorsTop 1%
Overall (All Time): #509 of 4,157,543Top 1%
437
Patents All Time

Issued Patents All Time

Showing 301–325 of 437 patents

Patent #TitleCo-InventorsDate
9929091 Vertical fuse structures Juntao Li, Chih-Chao Yang 2018-03-27
9917082 Approach to fabrication of an on-chip resistor with a field effect transistor Veeraraghavan S. Basker, Kangguo Cheng, Theodorus E. Standaert 2018-03-13
9917105 Replacement fin process in SSOI wafer Bruce B. Doris, Hong He, Ali Khakifirooz 2018-03-13
9917081 Semiconductor device including finFET and fin varactor Kangguo Cheng, Ruilong Xie, Tenko Yamashita 2018-03-13
9911738 Vertical-transport field-effect transistors with a damascene gate strap Hiroaki Niimi, Kwan-Yong Lim, Brent A. Anderson 2018-03-06
9911663 Preventing buried oxide gouging during planar and FinFET processing on SOI Kern Rim 2018-03-06
9911657 Semiconductor device including finFET and fin varactor Kangguo Cheng, Ruilong Xie, Tenko Yamashita 2018-03-06
9911601 Epitaxial silicon germanium fin formation using sacrificial silicon fin templates Hong He, Juntao Li, Chih-Chao Yang 2018-03-06
9905469 Method and structure for forming FinFET CMOS with dual doped STI regions Veeraraghavan S. Basker, Kangguo Cheng, Theodorus E. Standaert 2018-02-27
9893154 Recess liner for silicon germanium fin formation Timothy J. McArdle, Judson R. Holt 2018-02-13
9882048 Gate cut on a vertical field effect transistor with a defined-width inorganic mask Brent A. Anderson, Sivananda K. Kanakasabapathy, Jeffrey C. Shearer, Stuart A. Sieg, John R. Sporre 2018-01-30
9881869 Middle of the line integrated efuse in trench EPI structure Hong He, Juntao Li, Chih-Chao Yang 2018-01-30
9882006 Silicon germanium fin channel formation Hong He, Nicolas Loubet 2018-01-30
9881926 Static random access memory (SRAM) density scaling by using middle of line (MOL) flow Veeraraghavan S. Basker, Kangguo Cheng, Sivananda K. Kanakasabapathy, Theodorus E. Standaert 2018-01-30
9876009 CMOS compatible fuse or resistor using self-aligned contacts Veeraraghavan S. Basker, Kangguo Cheng, Theodorus E. Standaert 2018-01-23
9871116 Replacement metal gate structures Veeraraghavan S. Basker, Kangguo Cheng, Theodorus E. Standaert 2018-01-16
9865739 Replacement metal gate structures Veeraraghavan S. Basker, Kangguo Cheng, Theodorus E. Standaert 2018-01-09
9853127 Silicidation of bottom source/drain sheet using pinch-off sacrificial spacer process Brent A. Anderson, Huiming Bu, Terence B. Hook, Fee Li Lie 2017-12-26
9853022 MIM capacitor formation in RMG module Veeraraghavan S. Basker, Kangguo Cheng, Theodorus E. Standaert 2017-12-26
9847261 Metal reflow for middle of line contacts Juntao Li, Chih-Chao Yang 2017-12-19
9842931 Self-aligned shallow trench isolation and doping for vertical fin transistors Brent A. Anderson, Fee Li Lie 2017-12-12
9837535 Directional deposition of protection layer Hong He, Juntao Li, Chih-Chao Yang 2017-12-05
9837309 Semiconductor via structure with lower electrical resistance Lawrence A. Clevenger, Baozhen Li, Kirk D. Peterson, Terry A. Spooner 2017-12-05
9818650 Extra gate device for nanosheet Bruce B. Doris, Terence B. Hook 2017-11-14
9812567 Precise control of vertical transistor gate length Veeraraghavan S. Basker, Kangguo Cheng, Theodorus E. Standaert 2017-11-07