Issued Patents All Time
Showing 51–75 of 160 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10763210 | Circular ring shaped antifuse device | Chih-Chao Yang | 2020-09-01 |
| 10741441 | Collar formation for chamfer-less and chamfered vias | Chih-Chao Yang, Andrew Tae Kim | 2020-08-11 |
| 10699950 | Method of optimizing wire RC for device performance and reliability | Lawrence A. Clevenger, Kirk D. Peterson, John E. Sheets, II, Terry A. Spooner | 2020-06-30 |
| 10651083 | Graded interconnect cap | Andrew Tae Kim, Ernest Y. Wu, Chih-Chao Yang | 2020-05-12 |
| 10636738 | Contacts having a geometry to reduce resistance | Lawrence A. Clevenger, Kirk D. Peterson, Terry A. Spooner, Junli Wang | 2020-04-28 |
| 10615112 | MIM capacitor for improved process defect tolerance | Chih-Chao Yang, Andrew Tae Kim | 2020-04-07 |
| 10539611 | Integrated circuit chip reliability qualification using a sample-specific expected fail rate | Jeanne P. Bickford, Nazmul Habib, Tad J. Wilder | 2020-01-21 |
| 10534888 | Hybrid back end of line metallization to balance performance and reliability | Chih-Chao Yang, Theo Standaert | 2020-01-14 |
| 10490513 | Advanced crack stop structure | Chih-Chao Yang, Xiao Hu Liu, Griselda Bonilla | 2019-11-26 |
| 10475753 | Advanced crack stop structure | Chih-Chao Yang, Xiao Hu Liu, Griselda Bonilla | 2019-11-12 |
| 10468346 | Advanced interconnects containing an IMT liner | Joseph F. Maniscalco, Andrew Tae Kim, Chih-Chao Yang | 2019-11-05 |
| 10468491 | Low resistance contact for transistors | Lawrence A. Clevenger, Junli Wang, Kirk D. Peterson, Terry A. Spooner, John E. Sheets, II | 2019-11-05 |
| 10460990 | Semiconductor via structure with lower electrical resistance | Lawrence A. Clevenger, Kirk D. Peterson, Terry A. Spooner, Junli Wang | 2019-10-29 |
| 10460985 | Enhancement of iso-via reliability | Lawrence A. Clevenger, Xiao Hu Liu, Kirk D. Peterson | 2019-10-29 |
| 10396042 | Dielectric crack stop for advanced interconnects | Chih-Chao Yang, Griselda Bonilla | 2019-08-27 |
| 10361265 | Precision BEOL resistors | Kirk D. Peterson, John E. Sheets, II, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang | 2019-07-23 |
| 10340330 | Precision BEOL resistors | Kirk D. Peterson, John E. Sheets, II, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang | 2019-07-02 |
| 10332956 | Precision beol resistors | Kirk D. Peterson, John E. Sheets, II, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang | 2019-06-25 |
| 10332955 | Precision BEOL resistors | Kirk D. Peterson, John E. Sheets, II, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang | 2019-06-25 |
| 10262934 | Three plate MIM capacitor via integrity verification | Andrew Tae Kim, Barry P. Linder, Ernest Y. Wu | 2019-04-16 |
| 10256145 | Semiconductor device and method of forming the semiconductor device | Lawrence A. Clevenger, Kirk D. Peterson, John E. Sheets, II, Junli Wang, Chih-Chao Yang | 2019-04-09 |
| 10229873 | Three plate MIM capacitor via integrity verification | Andrew Tae Kim, Barry P. Linder, Ernest Y. Wu | 2019-03-12 |
| 10216870 | Methodology to prevent metal lines from current pulse damage | Jeanne P. Bickford, Nazmul Habib, Tad J. Wilder | 2019-02-26 |
| 10103060 | Test structures for dielectric reliability evaluations | David G. Brochu, JR., Roger A. Dufresne, Barry P. Linder, James H. Stathis, Ernest Y. Wu | 2018-10-16 |
| 10090240 | Interconnect structure with capacitor element and related methods | Chih-Chao Yang, Keith Kwong Hon Wong | 2018-10-02 |