| 12406119 |
Processor chip timing adjustment enhancement |
Todd A. Christensen, Eric Marz, Kirk D. Peterson |
2025-09-02 |
| 11171063 |
Metalization repair in semiconductor wafers |
Lawrence A. Clevenger, Baozhen Li, Kirk D. Peterson |
2021-11-09 |
| 11171064 |
Metalization repair in semiconductor wafers |
Lawrence A. Clevenger, Baozhen Li, Kirk D. Peterson |
2021-11-09 |
| 11018084 |
Managed integrated circuit power supply distribution |
Anthony Gus Aipperspach, Jeffrey Douglas Brown, Kirk D. Peterson |
2021-05-25 |
| 10943972 |
Precision BEOL resistors |
Baozhen Li, Kirk D. Peterson, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang |
2021-03-09 |
| 10923575 |
Low resistance contact for transistors |
Lawrence A. Clevenger, Junli Wang, Kirk D. Peterson, Baozhen Li, Terry A. Spooner |
2021-02-16 |
| 10784159 |
Semiconductor device and method of forming the semiconductor device |
Lawrence A. Clevenger, Baozhen Li, Kirk D. Peterson, Junli Wang, Chih-Chao Yang |
2020-09-22 |
| 10699950 |
Method of optimizing wire RC for device performance and reliability |
Lawrence A. Clevenger, Baozhen Li, Kirk D. Peterson, Terry A. Spooner |
2020-06-30 |
| 10580730 |
Managed integrated circuit power supply distribution |
Anthony Gus Aipperspach, Jeffrey Douglas Brown, Kirk D. Peterson |
2020-03-03 |
| 10468491 |
Low resistance contact for transistors |
Lawrence A. Clevenger, Junli Wang, Kirk D. Peterson, Baozhen Li, Terry A. Spooner |
2019-11-05 |
| 10361265 |
Precision BEOL resistors |
Baozhen Li, Kirk D. Peterson, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang |
2019-07-23 |
| 10340330 |
Precision BEOL resistors |
Baozhen Li, Kirk D. Peterson, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang |
2019-07-02 |
| 10332956 |
Precision beol resistors |
Baozhen Li, Kirk D. Peterson, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang |
2019-06-25 |
| 10332955 |
Precision BEOL resistors |
Baozhen Li, Kirk D. Peterson, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang |
2019-06-25 |
| 10256145 |
Semiconductor device and method of forming the semiconductor device |
Lawrence A. Clevenger, Baozhen Li, Kirk D. Peterson, Junli Wang, Chih-Chao Yang |
2019-04-09 |
| 9997408 |
Method of optimizing wire RC for device performance and reliability |
Lawrence A. Clevenger, Baozhen Li, Kirk D. Peterson, Terry A. Spooner |
2018-06-12 |
| 9966308 |
Semiconductor device and method of forming the semiconductor device |
Lawrence A. Clevenger, Baozhen Li, Kirk D. Peterson, Junli Wang, Chih-Chao Yang |
2018-05-08 |
| 9570388 |
FinFET power supply decoupling |
Todd A. Christensen |
2017-02-14 |
| 9520876 |
Power gating and clock gating in wiring levels |
Nathaniel R. Chadwick, Tassbieh Hassan, Kirk D. Peterson, Christine Whiteside |
2016-12-13 |
| 9455251 |
Decoupling capacitor using finFET topology |
Todd A. Christensen |
2016-09-27 |
| 9405311 |
Bias-temperature induced damage mitigation circuit |
David M. Onsongo, David P. Paulsen, Kirk D. Peterson |
2016-08-02 |
| 9401643 |
Bias-temperature induced damage mitigation circuit |
David M. Onsongo, David P. Paulsen, Kirk D. Peterson |
2016-07-26 |
| 8531203 |
Mask alignment, rotation and bias monitor utilizing threshold voltage dependence |
Todd A. Christensen, Matthew James Paschal |
2013-09-10 |
| 8300450 |
Implementing physically unclonable function (PUF) utilizing EDRAM memory cell capacitance variation |
Todd A. Christensen |
2012-10-30 |