NY

Naomi Yoshida

Applied Materials: 41 patents #220 of 7,310Top 4%
BA Babcock-Hitachi: 4 patents #64 of 415Top 20%
University of California: 3 patents #2,984 of 18,278Top 20%
VA Varian Semiconductor Equipment Associates: 2 patents #228 of 513Top 45%
📍 Sunnyvale, CA: #351 of 14,302 inventorsTop 3%
🗺 California: #8,171 of 386,348 inventorsTop 3%
Overall (All Time): #55,938 of 4,157,543Top 2%
49
Patents All Time

Issued Patents All Time

Showing 26–49 of 49 patents

Patent #TitleCo-InventorsDate
9865735 Horizontal gate all around and FinFET device isolation Shiyu Sun, Theresa Kramer Guarini, Sung Won Jun, Vanessa Pena, Errol Antonio C. Sanchez +4 more 2018-01-09
9773663 Self-limiting and saturating chemical vapor deposition of a silicon bilayer and ALD Jessica S. Kachian, Mei Chang, Mary Edmonds, Andrew C. Kummel, Sang Wook Park +1 more 2017-09-26
9748354 Multi-threshold voltage structures with a lanthanum nitride film and methods of formation thereof Wei V. Tang, Paul F. Ma, Steven C. H. Hung, Michael P. Chudzik, Siddarth A. Krishnan +6 more 2017-08-29
9748364 Method for fabricating three dimensional device Shiyu Sun, Benjamin Colombeau, Hans-Joachim L. Gossmann 2017-08-29
9673277 Methods and apparatus for forming horizontal gate all around device structures Adam Brand, Bingxi Wood, Lin Dong, Shiyu Sun, Chi Nung Ni +1 more 2017-06-06
9484406 Method for fabricating nanowires for horizontal gate all around devices for semiconductor applications Shiyu Sun, Bingxi Wood 2016-11-01
9460920 Horizontal gate all around device isolation Shiyu Sun, Theresa Kramer Guarini, Sung Won Jun, Benjamin Colombeau, Michael Chudzik 2016-10-04
9355820 Methods for removing carbon containing films Wei Liu, Mandar B. Pandit 2016-05-31
9018054 Metal gate structures for field effect transistors and method of fabrication Adam Brand 2015-04-28
8349741 Amorphous carbon deposition method for improved stack defectivity Hang Yu, Deenesh Padhi, Man-Ping Cai, Li Yan Miao, Siu F. Cheng +4 more 2013-01-08
8227352 Amorphous carbon deposition method for improved stack defectivity Hang Yu, Deenesh Padhi, Man-Ping Cai, Li Yan Miao, Siu F. Cheng +4 more 2012-07-24
7365529 Test structure design for reliability test Toshiyuki Nagata 2008-04-29
7324137 System for automatically generating continuous developed still image from video image of inner wall of tubular object Naomichi Akizuki, Agus Suharno 2008-01-29
7119571 Test structure design for reliability test Toshiyuki Nagata 2006-10-10
6852626 Film deposition method and apparatus Yuichi Wada, Hiroyuki Yarita, Hisashi Aida 2005-02-08
6833117 Exhaust emission control catalyst element, catalyst structure, production method thereof, exhaust emission control apparatus and exhaust emission control method using the apparatus Yasuyoshi Kato, Yoshinori Nagai, Kouichi Yokoyama, Takashi Michimoto, Eiji Miyamoto +1 more 2004-12-21
6593252 Film deposition method and apparatus Yuichi Wada, Hiroyuki Yarita, Hisashi Aida 2003-07-15
6576567 Film deposition method and apparatus for semiconductor devices Yuichi Wada, Hiroyuki Yarita, Hisashi Aida 2003-06-10
6511538 Film deposition method and apparatus for semiconductor devices Yuichi Wada, Hiroyuki Yarita, Hisashl Aida 2003-01-28
6488984 Film deposition method and apparatus Yuichi Wada, Hiroyuki Yarita, Hisashi Aida 2002-12-03
5953630 Suppression of tungsten film deposition on a semiconductor wafer bevel edge with a halogenide purge gas Yuji Maeda, Katsumi Mitani, Manabu Yamazaki, Keiichi Tanaka 1999-09-14
5294584 Process for producing a denitration catalyst Hitoshi Yamasaki, Ikuhisa Hamada, Yasuyoshi Kato, Kunihiko Konishi, Toshiaki Matsuda +1 more 1994-03-15
5155083 Catalyst for reducing nitrogen oxides and process for making the catalyst Hitoshi Yamasaki, Ikuhisa Hamada, Yasuyoshi Kato, Kunihiko Konishi, Toshiaki Matsuda +1 more 1992-10-13
5059576 Catalyst for removing nitrogen oxides and a process for producing the same Yasuyoshi Kato, Fumito Nakajima, Ikuhisa Hamada, Masahiro Nitta, Kunihiko Konishi +3 more 1991-10-22