TN

Toshiyuki Nagata

TI Texas Instruments: 16 patents #831 of 12,488Top 7%
HK Hamamatsu Photonics K.K.: 8 patents #260 of 1,436Top 20%
Applied Materials: 2 patents #3,641 of 7,310Top 50%
CK Cavendish Kinetics: 1 patents #20 of 35Top 60%
FH Fuji Oil Holdings: 1 patents #159 of 368Top 45%
TC Toagosei Co.: 1 patents #155 of 338Top 50%
📍 Los Gatos, CA: #276 of 2,986 inventorsTop 10%
🗺 California: #17,896 of 386,348 inventorsTop 5%
Overall (All Time): #131,260 of 4,157,543Top 4%
29
Patents All Time

Issued Patents All Time

Showing 1–25 of 29 patents

Patent #TitleCo-InventorsDate
D888277 Substrate for spectroscopic analysis Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama, Mitsuhiro Ito +1 more 2020-06-23
D838002 Substrate for spectroscopic analysis Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama, Mitsuhiro Ito +1 more 2019-01-08
D835798 Substrate for spectroscopic analysis Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama, Mitsuhiro Ito +1 more 2018-12-11
D835802 Substrate for spectroscopic analysis Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama, Mitsuhiro Ito +1 more 2018-12-11
D835803 Substrate for spectroscopic analysis Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama, Mitsuhiro Ito +1 more 2018-12-11
D825360 Substrate for spectroscopic analysis Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Yoshihiro Maruyama, Mitsuhiro Ito +1 more 2018-08-14
9589731 MEMS variable capacitor with enhanced RF performance Robertus Petrus Van Kampen, Anartz Unamuno, Richard L. Knipe, Vikram Joshi, Roberto Gaddi 2017-03-07
D733911 Substrate for spectroscopic analysis Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Hiroki Oyama, Yoshihiro Maruyama +2 more 2015-07-07
D733913 Substrate for spectroscopic analysis Masashi Ito, Katsumi Shibayama, Kazuto Ofuji, Hiroki Oyama, Yoshihiro Maruyama +2 more 2015-07-07
7638401 Memory device with surface-channel peripheral transistors 2009-12-29
7365529 Test structure design for reliability test Naomi Yoshida 2008-04-29
7339220 Memory device with surface-channel peripheral transistors 2008-03-04
7119571 Test structure design for reliability test Naomi Yoshida 2006-10-10
6873001 Reduced size plate layer improves misalignments for CUB DRAM Hiroyuki Yoshida, Masayuki Moroi, Atsushi Satoh 2005-03-29
6580112 Method for fabricating an open can-type stacked capacitor on an uneven surface Yoichi Miyai, Masayuki Moroi, Katsushi Boku 2003-06-17
6486023 Memory device with surface-channel peripheral transistor 2002-11-26
6486518 Structures and method with bitline self-aligned to vertical connection Yasuhiro Okumoto, Michio Nishimura 2002-11-26
6381166 Semiconductor memory device having variable pitch array Hiroyuki Yoshida, Atsushi Satoh, Shuzoh Shiosaki 2002-04-30
6291293 Method for fabricating an open can-type stacked capacitor on an uneven surface Yoichi Miyai, Masayuki Moroi, Katsushi Boku 2001-09-18
6166941 Relaxed layout for storage nodes for dynamic random access memories Hiroyuki Yoshida 2000-12-26
6121248 Anti-viral agent Mineo Saneyoshi 2000-09-19
6028784 Ferroelectric memory device having compact memory cell array Kazuya Mori 2000-02-22
5861649 Trench-type semiconductor memory device Hiroyuki Yoshida, Takayuki Niuya, Yoichi Miyai, Yoshihiro Ogata 1999-01-19
5804478 Method of forming a trench-type semiconductor memory device Hiroyuki Yoshida, Takayuki Niuya, Yoshihiro Ogata 1998-09-08
5563433 French-type semiconductor memory device with enhanced trench capacitor-transistor connection Hiroyuki Yoshida, Takayuki Niuya, Yoshihiro Ogata 1996-10-08