Issued Patents All Time
Showing 1–25 of 51 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11664405 | Semiconductor light detection element | Masashi Ito, Katsumi Shibayama, Akira Sakamoto | 2023-05-30 |
| 11205676 | Semiconductor light detection element | Masashi Ito, Katsumi Shibayama, Akira Sakamoto | 2021-12-21 |
| D888275 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama, Mitsuhiro Ito | 2020-06-23 |
| D888276 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2020-06-23 |
| D888277 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama, Mitsuhiro Ito, Toshiyuki Nagata +1 more | 2020-06-23 |
| 10656094 | Surface-enhanced Raman scattering unit | Masashi Ito, Katsumi Shibayama, Hiroki Oyama, Yoshihiro Maruyama | 2020-05-19 |
| 10551322 | Surface-enhanced Raman scattering unit including integrally formed handling board | Masashi Ito, Katsumi Shibayama, Toshimitsu Kawai, Hiroki Oyama, Yoshihiro Maruyama +3 more | 2020-02-04 |
| 10408761 | Surface-enhanced Raman scattering element | Masashi Ito, Katsumi Shibayama, Takafumi Yokino, Masaki Hirose, Toshimitsu Kawai +1 more | 2019-09-10 |
| 10393663 | Surface-enhanced raman scattering element and method for manufacturing same | Katsumi Shibayama, Masashi Ito, Hiroki Oyama, Yoshihiro Maruyama, Nao Inoue | 2019-08-27 |
| D855209 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2019-07-30 |
| D855205 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2019-07-30 |
| D855206 | Substrate for spectroscopic analysis | Masahi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2019-07-30 |
| D855207 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2019-07-30 |
| D855208 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2019-07-30 |
| D855210 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2019-07-30 |
| D854184 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2019-07-16 |
| 10281404 | Surface-enhanced raman scattering unit and raman spectroscopic analysis method | Masashi Ito, Katsumi Shibayama, Hiroki Oyama, Yoshihiro Maruyama | 2019-05-07 |
| D843594 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2019-03-19 |
| D843013 | Substrates for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2019-03-12 |
| D843012 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2019-03-12 |
| D843011 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2019-03-12 |
| D843010 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama | 2019-03-12 |
| 10184895 | Surface-enhanced raman scattering unit, and method for using same | Katsumi Shibayama, Masashi Ito, Takafumi Yokino, Masaki Hirose, Anna Yoshida +1 more | 2019-01-22 |
| D838003 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama, Mitsuhiro Ito | 2019-01-08 |
| D838001 | Substrate for spectroscopic analysis | Masashi Ito, Katsumi Shibayama, Yoshihiro Maruyama, Mitsuhiro Ito | 2019-01-08 |