Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12300554 | Systems and methods for analyzing defects in CVD films | Mandar B. Pandit, Wenhui Li, Michael Wenyoung Tsiang, Praket P. Jha, Jingmin Leng | 2025-05-13 |
| 11699623 | Systems and methods for analyzing defects in CVD films | Mandar B. Pandit, Wenhui Li, Michael Wenyoung Tsiang, Praket P. Jha, Jingmin Leng | 2023-07-11 |
| 8349741 | Amorphous carbon deposition method for improved stack defectivity | Hang Yu, Deenesh Padhi, Naomi Yoshida, Li Yan Miao, Siu F. Cheng +4 more | 2013-01-08 |
| 8227352 | Amorphous carbon deposition method for improved stack defectivity | Hang Yu, Deenesh Padhi, Naomi Yoshida, Li Yan Miao, Siu F. Cheng +4 more | 2012-07-24 |
| 5870187 | Method for aligning semiconductor wafer surface scans and identifying added and removed particles resulting from wafer handling or processing | Yuri S. Uritsky, Patrick Kinney | 1999-02-09 |