Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
PK

Patrick Kinney — 26 Patents

TATecan Trading Ag: 6 patents #26 of 237Top 15%
Applied Materials: 6 patents #1,938 of 7,310Top 30%
TFThermo Fisher: 4 patents #556 of 2,015Top 30%
ABApplied Biosystems: 4 patents #198 of 690Top 30%
Hayward, CA: #50 of 1,120 inventorsTop 5%
California: #20,975 of 386,348 inventorsTop 6%
Overall (All Time): #150,017 of 4,157,543Top 4%
26 Patents All Time
Patrick Kinney has been granted 26 US patents while listed as an inventor at Applied Materials. The first was granted in 1992 and the most recent in October 2025. Patrick Kinney ranks #150,017 of 4,157,543 US inventors in our database (top 3.6%). Patent records list Patrick Kinney in Hayward, CA, US.

Issued Patents All Time

Showing 1–25 of 26 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12455293 Iterative liquid aspiration Matthias DZUNG, Philipp Ott, Carsten Hase, Andreas Schenk, David Papencordt +2 more 2025-10-28
12436068 3D-printed mask for lysing at a location on a tissue section Philipp Ott, Adrian SAGER 2025-10-07
12434234 Pipette tip extension, pipette tip, assembly of pipette tip and pipette tip extension, and method of use Subramaniam V. Iyer, Philipp Ott, Adrian SAGER 2025-10-07
12290804 Method of treating a sample Sujata Iyer, Philipp Ott, Adrian SAGER 2025-05-06
12115532 Cartridge, electrowetting sample processing system and bead manipulation method Sujata Iyer, Tin Ngo, Jennifer Ji, Marta Matvienko, Tiffany Ding (Lay) 2024-10-15
11992833 Pipette tip extension for treating a sample with a liquid attachable to a pipette tip Adrian SAGER, Philipp Ott, Hagen Reinhardt, Michael Keller, Sujata Iyer 2024-05-28
11951482 Cartridge and electrowetting sample processing system with delivery zone Tiffany Ding (Lay), Manjeet Dhindsa, Daniel Tran, Jennifer Ji, Sujata Iyer +1 more 2024-04-09
11933760 Cartridge, electrowetting sample processing system and droplet formation Tin Ngo, Sujata Iyer, Daniel Hoffmeyer, Manjeet Dhindsa, Tiffany Ding (Lay) 2024-03-19
11666914 Cartridge, electrowetting sample processing system and bead manipulation method Sujata Iyer, Tin Ngo, Jennifer Ji, Marta Matvienko, Tiffany Ding (Lay) 2023-06-06
8934098 Fast-indexing filter wheel and method of use David M. Cox, Marc Haberstroh, Albert L. Carrillo, Jon Hoshizaki, Maryam Shariati +3 more 2015-01-13
8602958 Methods and assemblies for collecting liquid by centrifugation Michele Elizabeth Wisniewski, Jon Hoshizaki, David M. Liu, Joon Mo Yang 2013-12-10 $13,907,000
8530158 System and method for processing a biological sample Maengseok Song, Achim Karger 2013-09-10 $34,106,000
7928354 Methods and systems for in situ calibration of imaging in biological analysis Ryan J. Talbot 2011-04-19 $21,031,000
7875425 Methods for monitoring polymerase chain reactions Stephen J. Gunstream 2011-01-25
7541567 Methods and systems for in situ validation of imaging in biological analysis Ryan J. Talbot 2009-06-02
7394943 Methods, software, and apparatus for focusing an optical system using computer image analysis Howard King, Michael C. Pallas, Mark Douglas Naley 2008-07-01
7045756 Methods and systems for in situ calibration of imaging in biological analysis Ryan J. Talbot 2006-05-16
6809809 Optical method and apparatus for inspecting large area planar objects Anand Gupta, Nagaraja Rao 2004-10-26
6630996 Optical method and apparatus for inspecting large area planar objects Nagaraja Rao 2003-10-07
6122562 Method and apparatus for selectively marking a semiconductor wafer Yuri S. Uritsky, Nagaraja Rao 2000-09-19 $59,626,000
5985680 Method and apparatus for transforming a substrate coordinate system into a wafer analysis tool coordinate system Ajay Singhal, Yuri S. Uritsky 1999-11-16 $69,047,000
5909276 Optical inspection module and method for detecting particles and defects on substrates in integrated process tools Nagaraja Rao 1999-06-01
5870187 Method for aligning semiconductor wafer surface scans and identifying added and removed particles resulting from wafer handling or processing Yuri S. Uritsky, Man-Ping Cai 1999-02-09 $105,990,000
5422724 Multiple-scan method for wafer particle analysis Yuri S. Uritsky, Harry Q. Lee 1995-06-06 $14,033,000
5267017 Method of particle analysis on a mirror wafer Yuri S. Uritsky, Harry Q. Lee, Kang-Ho Ahn 1993-11-30 $35,615,000