Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for transforming a substrate coordinate system into a wafer analysis tool coordinate system

Method and apparatus for transforming a substrate coordinate system into a wafer analysis tool coordinate system

US Patent 5985680 · Granted Nov 16, 1999

Estimated economic value: $69,047,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Iterative liquid aspiration2025
Pipette tip extension, pipette tip, assembly of pipette tip and pipette tip exte2025
3D-printed mask for lysing at a location on a tissue section2025
Method of treating a sample2025
Privacy screen2025
Cartridge, electrowetting sample processing system and bead manipulation method2024
Pipette tip extension for treating a sample with a liquid attachable to a pipett2024
Cartridge and electrowetting sample processing system with delivery zone2024
Cartridge, electrowetting sample processing system and droplet formation2024
Household cleaning appliance with a dispensing system operable between a single 2023
Cartridge, electrowetting sample processing system and bead manipulation method2023
Dishwasher rack assembly2022