Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12300554 | Systems and methods for analyzing defects in CVD films | Mandar B. Pandit, Man-Ping Cai, Wenhui Li, Michael Wenyoung Tsiang, Praket P. Jha | 2025-05-13 |
| 11699623 | Systems and methods for analyzing defects in CVD films | Mandar B. Pandit, Man-Ping Cai, Wenhui Li, Michael Wenyoung Tsiang, Praket P. Jha | 2023-07-11 |
| 7747424 | Scatterometry multi-structure shape definition with multi-periodicity | Jon Opsal | 2010-06-29 |
| 6465265 | Analysis of interface layer characteristics | Jon Opsal | 2002-10-15 |