KC

Kangguo Cheng

IBM: 304 patents #1 of 11,274Top 1%
TE Tessera: 10 patents #1 of 99Top 2%
ET Elpis Technologies: 9 patents #1 of 95Top 2%
Globalfoundries: 8 patents #22 of 583Top 4%
Samsung: 1 patents #7,050 of 16,666Top 45%
📍 Schenectady, NY: #1 of 134 inventorsTop 1%
🗺 New York: #1 of 13,306 inventorsTop 1%
Overall (2020): #1 of 565,922Top 1%
332
Patents 2020

Issued Patents 2020

Showing 201–225 of 332 patents

Patent #TitleCo-InventorsDate
10622486 Tilted nanowire transistor Pouya Hashemi, Alexander Reznicek, Karthik Balakrishnan 2020-04-14
10622454 Formation of a semiconductor device with RIE-free spacers Xin Miao, Wenyu Xu, Chen Zhang 2020-04-14
10622354 FinFETs with controllable and adjustable channel doping Xin Miao, Wenyu Xu, Chen Zhang 2020-04-14
10622264 Nanosheet devices with different types of work function metals Xin Miao, Wenyu Xu, Chen Zhang 2020-04-14
10622260 Vertical transistor with reduced parasitic capacitance Ruilong Xie, Chanro Park 2020-04-14
10622259 Semiconductor devices with sidewall spacers of equal thickness Balasubramanian Pranatharthiharan, Soon-Cheon Seo 2020-04-14
10620158 High density nano-array for sensing Qing Cao, Zhengwen Li, Fei Liu, Zhen Zhang 2020-04-14
10615082 VFET metal gate patterning for vertical transport field effect transistor Brent A. Anderson, Ruqiang Bao, Hemanth Jagannathan, Choonghyun Lee, Junli Wang 2020-04-07
10615288 Integration scheme for non-volatile memory on gate-all-around structure Dexin Kong, Zhenxing Bi, Zheng Xu 2020-04-07
10615278 Preventing strained fin relaxation Bruce B. Doris, Hong He, Sivananda K. Kanakasabapathy, Gauri Karve, Juntao Li +3 more 2020-04-07
10615277 VFET CMOS dual epitaxy integration Ruilong Xie, Tenko Yamashita, Chun-Chen Yeh 2020-04-07
10615269 Nanosheet channel-to-source and drain isolation Marc A. Bergendahl, Fee Li Lie, Eric R. Miller, John R. Sporre, Sean Teehan 2020-04-07
10615267 Semiconductor device strain relaxation buffer layer Xin Miao, Wenyu Xu, Chen Zhang 2020-04-07
10615258 Nanosheet semiconductor structure with inner spacer formed by oxidation Xin Miao, Chen Zhang, Wenyu Xu 2020-04-07
10615256 Nanosheet transistor gate structure having reduced parasitic capacitance Xin Miao, Wenyu Xu, Chen Zhang 2020-04-07
10615166 Programmable device compatible with vertical transistor flow Juntao Li, Geng Wang, Qintao Zhang 2020-04-07
10615161 III-V fins by aspect ratio trapping and self-aligned etch to remove rough epitaxy surface Jeehwan Kim 2020-04-07
10615159 Integrated LDMOS and VFET transistors Juntao Li, Geng Wang, Qintao Zhang 2020-04-07
10604407 Nanoparticle structure and process for manufacture Qing Cao, Juntao Li 2020-03-31
10608121 FinFET transistor gate and epitaxy formation Ruqiang Bao, Zhenxing Bi, Zheng Xu 2020-03-31
10608109 Vertical transistor with enhanced drive current Xin Miao, Alexander Reznicek 2020-03-31
10608100 Unipolar spacer formation for finFETs Peng Xu, Jie Yang 2020-03-31
10608096 Formation of air gap spacers for reducing parasitic capacitance Peng Xu, Choonghyun Lee, Heng Wu 2020-03-31
10608083 Non-planar field effect transistor devices with low-resistance metallic gate structures Chen Zhang, Wenyu Xu, Xin Miao 2020-03-31
10607991 Air gap spacer for metal gates Marc A. Bergendahl, Fee Li Lie, Eric R. Miller, John R. Sporre, Sean Teehan 2020-03-31