KC

Kangguo Cheng

IBM: 304 patents #1 of 11,274Top 1%
TE Tessera: 10 patents #1 of 99Top 2%
ET Elpis Technologies: 9 patents #1 of 95Top 2%
Globalfoundries: 8 patents #22 of 583Top 4%
Samsung: 1 patents #7,050 of 16,666Top 45%
📍 Schenectady, NY: #1 of 134 inventorsTop 1%
🗺 New York: #1 of 13,306 inventorsTop 1%
Overall (2020): #1 of 565,922Top 1%
332
Patents 2020

Issued Patents 2020

Showing 226–250 of 332 patents

Patent #TitleCo-InventorsDate
10607894 Fabrication of a pair of vertical fin field effect transistors having a merged top source/drain Xin Miao, Wenyu Xu, Chen Zhang 2020-03-31
10607892 Junction formation in thick-oxide and thin-oxide vertical FETs on the same chip Xin Miao, Wenyu Xu, Chen Zhang 2020-03-31
10607890 Selective removal of semiconductor fins Veeraraghavan S. Basker, Ali Khakifirooz 2020-03-31
10605768 Nanofluid sensor with real-time spatial sensing Ali Khakifirooz, Ghavam G. Shahidi, Davood Shahrjerdi 2020-03-31
10600693 Fabrication of a vertical fin field effect transistor with reduced dimensional variations 2020-03-24
10600889 Nanosheet transistors with thin inner spacers and tight pitch gate Choonghyun Lee, Juntao Li, Peng Xu 2020-03-24
10600886 Vertical field effect transistors with bottom source/drain epitaxy Xin Miao, Wenyu Xu, Chen Zhang 2020-03-24
10600885 Vertical fin field effect transistor devices with self-aligned source and drain junctions Juntao Li, Choonghyun Lee, Shogo Mochizuki 2020-03-24
10600878 Strained silicon germanium fin with block source/drain epitaxy and improved overlay capacitance Karthik Balakrishnan, Pouya Hashemi, Alexander Reznicek 2020-03-24
10600877 Fully depleted SOI device for reducing parasitic back gate capacitance Ramachandra Divakaruni 2020-03-24
10600870 Semiconductor structure with a silicon germanium alloy fin and silicon germanium alloy pad structure Pouya Hashemi, Ali Khakifirooz, Alexander Reznicek 2020-03-24
10600778 Method and apparatus of forming high voltage varactor and vertical transistor on a substrate Ruilong Xie, Tenko Yamashita, Chun-Chen Yeh 2020-03-24
10600695 Channel strain formation in vertical transport FETS with dummy stressor materials Choonghyun Lee, Shogo Mochizuki, Juntao Li 2020-03-24
10600638 Nanosheet transistors with sharp junctions Lawrence A. Clevenger, Balasubramanian S. Pranatharthi Haran, John H. Zhang 2020-03-24
10593598 Vertical FET with various gate lengths by an oxidation process Xin Miao, Chen Zhang 2020-03-17
10593802 Forming a sacrificial liner for dual channel devices Huiming Bu, Dechao Guo, Sivananda K. Kanakasabapathy, Peng Xu 2020-03-17
10593779 Replacement metal gate structures Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2020-03-17
10593753 Vertical field effect transistor (VFET) device with controllable top spacer Wenyu Xu, Chen Zhang, Xin Miao 2020-03-17
10593679 Static random access memory (SRAM) density scaling by using middle of line (MOL) flow Veeraraghavan S. Basker, Sivananda K. Kanakasabapathy, Theodorus E. Standaert, Junli Wang 2020-03-17
10593672 Method and structure of forming strained channels for CMOS device fabrication Juntao Li, John G. Gaudiello 2020-03-17
10593663 Distributed decoupling capacitor Ali Khakifirooz, Darsen D. Lu, Ghavam G. Shahidi 2020-03-17
10593622 Electrical fuse and/or resistors structures Veeraraghavan S. Basker, Ali Khakifirooz, Juntao Li 2020-03-17
10592698 Analog-based multiple-bit chip security Xin Miao, Wenyu Xu, Chen Zhang 2020-03-17
10586857 Replacement metal gate structures Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2020-03-10
10586867 Strained FinFET source drain isloation Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2020-03-10