JL

Jing-Cheng Lin

TSMC: 64 patents #5 of 2,904Top 1%
S( Semiconductor Manufacturing International (Beijing): 1 patents #17 of 108Top 20%
SP Semiconductor Technologies & Instruments Pte: 1 patents #3 of 5Top 60%
Overall (2018): #108 of 503,207Top 1%
67
Patents 2018

Issued Patents 2018

Showing 51–67 of 67 patents

Patent #TitleCo-InventorsDate
9960125 Method of forming a semiconductor package Chin-Chuan Chang, Jui-Pin Hung 2018-05-01
9960088 End point detection in grinding Yi-Chao Mao, Jui-Pin Hung, Shin-Puu Jeng, Chen-Hua Yu 2018-05-01
9953907 PoP device Chin-Chuan Chang, Nai-Wei Liu, Wan-Ting Shih 2018-04-24
9953955 Integrated fan-out package structures with recesses in molding compound Po-Hao Tsai, Li-Hui Cheng, Jui-Pin Hung 2018-04-24
9953949 Through package via (TPV) Po-Hao Tsai 2018-04-24
9953948 Pillar design for conductive bump Cheng-Chieh Hsieh, Cheng-Lin Huang, Po-Hao Tsai, Shang-Yun Hou, Shin-Puu Jeng 2018-04-24
9950450 Molding chamber apparatus and curing method Chen-Hua Yu, Shin-Puu Jeng, Jui-Pin Hung, Hsien-Wen Liu 2018-04-24
9947629 Method of forming contact holes in a fan out package Feng-Cheng Hsu, Szu-Wei Lu 2018-04-17
9941244 Protective layer for contact pads in fan-out interconnect structure and method of forming same Chin-Chuan Chang, Tsei-Chung Fu 2018-04-10
9929108 Backside redistribution layer (RDL) structure Po-Hao Tsai 2018-03-27
9929128 Chip package structure with adhesive layer Li-Hui Cheng, Po-Hao Tsai, Yi-Hang Lin 2018-03-27
9929109 Stacking of multiple dies for forming three dimensional integrated circuit (3DIC) structure Chih-Wei Wu, Ying-Ching Shih, Szu-Wei Lu 2018-03-27
9929050 Mechanisms for forming three-dimensional integrated circuit (3DIC) stacking structure 2018-03-27
9922903 Interconnect structure for package-on-package devices and a method of fabricating Jui-Pin Hung, Po-Hao Tsai, Yi-Jou Lin, Shuo-Mao Chen, Chiung-Han Yeh +1 more 2018-03-20
9895871 De-bonding and cleaning process and system Ying-Ching Shih, Szu-Wei Lu 2018-02-20
9859181 Underfill dispensing in 3D IC using metrology Szu-Wei Lu, I-Hsuan Peng 2018-01-02
9859112 Bonded semiconductor structures 2018-01-02