CL

Christopher F. Lyons

AM AMD: 18 patents #14 of 1,035Top 2%
📍 Wappingers Falls, NY: #1 of 138 inventorsTop 1%
🗺 New York: #14 of 9,035 inventorsTop 1%
Overall (2004): #328 of 270,089Top 1%
18
Patents 2004

Issued Patents 2004

Showing 1–18 of 18 patents

Patent #TitleCo-InventorsDate
6836398 System and method of forming a passive layer by a CMP process Ramkumar Subramanian, Jane V. Oglesby, Minh Van Ngo, Mark S. Chang, Sergey Lopatin +3 more 2004-12-28
6829040 Lithography contrast enhancement technique by varying focus with wavelength modulation Jongwook Kye, Ivan Lalovic, Ramkumar Subramanian 2004-12-07
6825060 Photosensitive polymeric memory elements Ramkumar Subramanian, Mark S. Chang 2004-11-30
6825114 Selective stress-inducing implant and resulting pattern distortion in amorphous carbon patterning Philip A. Fisher, Srikanteswara Dakshina-Murthy 2004-11-30
6808591 Model based metal overetch control Khoi A. Phan, Bharath Rangarajan, Steven C. Avanzino, Ramkumar Subramanian, Bhanwar Singh +1 more 2004-10-26
6803267 Silicon containing material for patterning polymeric memory element Ramkumar Subramanian, Matthew S. Buynoski, Patrick K. Cheung, Angela T. Hui, Ashok M. Khathuria +5 more 2004-10-12
6790790 High modulus filler for low k materials Bharath Rangarajan 2004-09-14
6787458 Polymer memory device formed in via opening Nicholas H. Tripsas, Matthew S. Buynoski, Suzette K. Pangrle, Uzodinma Okoroanyanwu, Angela T. Hui +7 more 2004-09-07
6773998 Modified film stack and patterning strategy for stress compensation and prevention of pattern distortion in amorphous carbon gate patterning Philip A. Fisher, Marina V. Plat, Chih-Yuh Yang, Scott A. Bell, Douglas J. Bonser +2 more 2004-08-10
6773954 Methods of forming passive layers in organic memory cells Ramkumar Subramanian, Jane V. Oglesby, Sergey Lopatin, Mark S. Chang, James J. Xie +1 more 2004-08-10
6771356 Scatterometry of grating structures to monitor wafer stress Bhanwar Singh, Steven C. Avanzino, Khoi A. Phan, Bharath Rangarajan, Ramkumar Subramanian +1 more 2004-08-03
6764949 Method for reducing pattern deformation and photoresist poisoning in semiconductor device fabrication Douglas J. Bonser, Marina V. Plat, Chih-Yuh Yang, Scott A. Bell, Darin A. Chan +6 more 2004-07-20
6753266 Method of enhancing gate patterning properties with reflective hard mask Todd P. Lukanc, Scott A. Bell, Marina V. Plat, Ramkumar Subramanian 2004-06-22
6740566 Ultra-thin resist shallow trench process using high selectivity nitride etch Scott A. Bell, Harry J. Levinson, Khanh B. Nguyen, Fei Wang, Chih-Yuh Yang 2004-05-25
6737222 Dual damascene process utilizing a bi-layer imaging layer Ramkumar Subramanian, Marina V. Plat, Scott A. Bell 2004-05-18
6689541 Process for forming a photoresist mask Scott A. Bell, Todd P. Lukanc, Marina V. Plat, Ramkumar Subramanian 2004-02-10
6686270 Dual damascene trench depth monitoring Ramkumar Subramanian 2004-02-03
6684172 Sensor to predict void free films using various grating structures and characterize fill performance Ramkumar Subramanian, Steven C. Avanzino, Khoi A. Phan, Bharath Rangarajan, Bhanwar Singh +1 more 2004-01-27