TI

Tadahiro Ishizaka

TL Tokyo Electron Limited: 68 patents #26 of 5,567Top 1%
📍 Nirasaki, NY: #1 of 7 inventorsTop 15%
Overall (All Time): #30,614 of 4,157,543Top 1%
68
Patents All Time

Issued Patents All Time

Showing 26–50 of 68 patents

Patent #TitleCo-InventorsDate
9540733 Film forming method, film forming apparatus and recording medium 2017-01-10
9425093 Copper wiring forming method, film forming system, and storage medium Takashi Sakuma, Osamu Yokoyama, Kai-Hung Yu 2016-08-23
9406558 Cu wiring fabrication method and storage medium Tatsuo Hirasawa, Takashi Sakuma, Osamu Yokoyama 2016-08-02
9406557 Copper wiring forming method with Ru liner and Cu alloy fill Osamu Yokoyama, Cheonsoo Han, Takashi Sakuma, Chiaki Yasumuro, Tatsuo Hirasawa +1 more 2016-08-02
9368418 Copper wiring structure forming method Kenji Suzuki 2016-06-14
9362166 Method of forming copper wiring Takashi Sakuma, Osamu Yokoyama, Kenji Matsumoto, Peng Chang, Hiroyuki Nagai 2016-06-07
9313895 Method for forming copper wiring Kenji Suzuki, Atsushi Shimada 2016-04-12
9101067 Method for forming copper wiring Toshio Hasegawa 2015-08-04
9064690 Method for forming Cu wiring Atsushi Gomi, Kenji Suzuki, Tatsuo Hatano, Hiroyuki Toshima, Yasushi Mizusawa 2015-06-23
8999841 Semiconductor device manufacturing method Atsushi Gomi, Kenzi Suzuki, Tatsuo Hatano, Yasushi Mizusawa 2015-04-07
8974868 Post deposition plasma cleaning system and method Audunn Ludviksson 2015-03-10
8859422 Method of forming copper wiring and method and system for forming copper film Atsushi Gomi, Takara Kato, Osamu Yokoyama, Takashi Sakuma, Chiaki Yasumuro +5 more 2014-10-14
8716132 Radiation-assisted selective deposition of metal-containing cap layers Shigeru Mizuno 2014-05-06
8399353 Methods of forming copper wiring and copper film, and film forming system Atsushi Gomi, Takara Kato, Osamu Yokoyama, Takashi Sakuma, Chiaki Yasumuro +4 more 2013-03-19
8372739 Diffusion barrier for integrated circuits formed from a layer of reactive metal and method of fabrication Satohiko Hoshino, Kuzuhiro Hamamoto, Shigeru Mizuno, Yasushi Mizusawa 2013-02-12
8242019 Selective deposition of metal-containing cap layers for semiconductor devices Shigeru Mizuno, Satohiko Hoshino, Hiroyuki Nagai, Yuki Chiba, Frank M. Cerio, Jr. 2012-08-14
8075698 Substrate processing unit, method of detecting end point of cleaning of substrate processing unit, and method of detecting end point of substrate processing Hiroshi Kannan, Yasuhiko Kojima, Yasuhiro Oshima, Takashi Shigeoka 2011-12-13
8058728 Diffusion barrier and adhesion layer for an interconnect structure Shigeru Mizuno 2011-11-15
8034406 Integrated substrate processing in a vacuum processing tool Masamichi Hara, Yasushi Mizusawa 2011-10-11
8026168 Semiconductor device containing an aluminum tantalum carbonitride barrier film and method of forming Shigeru Mizuno 2011-09-27
7989353 Method for in-situ refurbishing a ceramic substrate holder Kentaro Asakura, Masanao Ando, Toshio Hasegawa 2011-08-02
7977235 Method for manufacturing a semiconductor device with metal-containing cap layers 2011-07-12
7959985 Method of integrating PEALD Ta-containing films into Cu metallization Tsukasa Matsuda, Masamichi Hara, Jacques Faguet, Yasushi Mizusawa 2011-06-14
7884012 Void-free copper filling of recessed features for semiconductor devices Kenji Suzuki, Miho Jomen, Jonathan Rullan 2011-02-08
7846841 Method for forming cobalt nitride cap layers Shigeru Mizuno, Miho Jomen 2010-12-07