Issued Patents All Time
Showing 26–50 of 54 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9000798 | Method of test probe alignment control | Jui-Long Chen, Chien-Chih Liao, Tseng Chin Lo, Hui-Yun Chao, Ta-Yung Lee +1 more | 2015-04-07 |
| 8938698 | Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes | Jui-Long Chen, Hui-Yun Chao, Yen-Di Tsen | 2015-01-20 |
| 8925479 | System and method of dosage profile control | Keung Hui, Chun-Lin Chang | 2015-01-06 |
| 8889434 | Scanner overlay correction system and method | Yen-Di Tsen, Shin-Rung Lu | 2014-11-18 |
| 8793638 | Method of optimizing design for manufacturing (DFM) | Keuing Hui, Yen-Wei Cheng, Yen-Di Tsen, Chin-Hsiang Lin | 2014-07-29 |
| 8781614 | Semiconductor processing dispatch control | Sunny Wu, Yen-Di Tsen, Chun-Hsien Lin, Keung Hui, Jo Fei Wang | 2014-07-15 |
| 8685759 | E-chuck with automated clamped force adjustment and calibration | Jo Fei Wang, Sunny Wu | 2014-04-01 |
| 8627251 | Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes | Jui-Long Chen, Hui-Yun Chao, Yen-Di Tsen | 2014-01-07 |
| 8606387 | Adaptive and automatic determination of system parameters | Po-Feng Tsai, Chia-Tong Ho, Sunny Wu, Jo Fei Wang | 2013-12-10 |
| 8549012 | Processing exception handling | Po-Feng Tsai, Jin-Ning Sung, Yen-Di Tsen, Jo Fei Wang | 2013-10-01 |
| 8452439 | Device performance parmeter tuning method and system | Sunny Wu, Chun-Hsien Lin, Kun-Ming Chen, Dung-Yian Hsieh, Hui-Ru Lin +2 more | 2013-05-28 |
| 8406912 | System and method for data mining and feature tracking for fab-wide prediction and control | Jui-Long Chen, Chia-Tong Ho, Po-Feng Tsai, Hui-Yun Chao | 2013-03-26 |
| 8404572 | Multi-zone temperature control for semiconductor wafer | Chun-Lin Chang, Hsin-Hsien Wu, Zin-Chang Wei, Chi-Ming Yang, Chyi Shyuan Chern +4 more | 2013-03-26 |
| 8406904 | Two-dimensional multi-products multi-tools advanced process control | Chih-Wei Hsu, Yen-Di Tsen | 2013-03-26 |
| 8396583 | Method and system for implementing virtual metrology in semiconductor fabrication | Po-Feng Tsai, Andy Tsen, Jo Fei Wang | 2013-03-12 |
| 8394719 | System and method for implementing multi-resolution advanced process control | Andy Tsen, Jin-Ning Sung, Po-Feng Tsai, Yen-Wei Cheng | 2013-03-12 |
| 8392009 | Advanced process control with novel sampling policy | Wang Jo Fei, Andy Tsen, Ming-Yu Fan, Jill Wang | 2013-03-05 |
| 8309444 | System and method of dosage profile control | Keung Hui, Chun-Lin Chang | 2012-11-13 |
| 8295965 | Semiconductor processing dispatch control | Sunny Wu, Yen-Di Tsen, Chun-Hsien Lin, Keung Hui, Jo Fei Wang | 2012-10-23 |
| 8239056 | Advanced process control for new tapeout product | Chih-Wei Hsu, Yu-Jen Cheng, Wen-Pin Liu, Shun-Ping Wang, Shin-Rung Lu +3 more | 2012-08-07 |
| 8229588 | Method and system for tuning advanced process control parameters | Andy Tsen, Chih-Wei Hsu, Ming-Yeon Hung, Ming-Yu Fan, Wang Jo Fei | 2012-07-24 |
| 8219341 | System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) with routing model | Andy Tsen, Sunny Wu, Wang Jo Fei | 2012-07-10 |
| 8205173 | Physical failure analysis guiding methods | Sunny Wu, Yen-Di Tsen, Monghsung Chuang, Fu-Min Huang, Jo Fei Wang | 2012-06-19 |
| 8108060 | System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architecture | Andy Tsen, Jo Fei Wang, Po-Feng Tsai, Ming-Yu Fan, Jill Wang +1 more | 2012-01-31 |
| 8082055 | Method for a bin ratio forecast at new tape out stage | Chun-Hsien Lin, Andy Tsen, Jui-Long Chen, Sunny Wu, Chia-Hung Huang | 2011-12-20 |