Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11250433 | Using semi-supervised label procreation to train a risk determination model | Cezary Marcjan, Hung-Chih Yang, Jayaram NM Nanduri, Shoou-Jiun Wang | 2022-02-15 |
| 10113233 | Multi-zone temperature control for semiconductor wafer | Chun-Lin Chang, Hsin-Hsien Wu, Zin-Chang Wei, Chi-Ming Yang, Chyi Shyuan Chern +4 more | 2018-10-30 |
| 9023664 | Multi-zone temperature control for semiconductor wafer | Chun-Lin Chang, Hsin-Hsien Wu, Zin-Chang Wei, Chi-Ming Yang, Chyi Shyuan Chern +4 more | 2015-05-05 |
| 8404572 | Multi-zone temperature control for semiconductor wafer | Chun-Lin Chang, Hsin-Hsien Wu, Zin-Chang Wei, Chi-Ming Yang, Chyi Shyuan Chern +4 more | 2013-03-26 |
| 8392009 | Advanced process control with novel sampling policy | Wang Jo Fei, Andy Tsen, Jill Wang, Jong-I Mou | 2013-03-05 |
| 8229588 | Method and system for tuning advanced process control parameters | Andy Tsen, Chih-Wei Hsu, Ming-Yeon Hung, Wang Jo Fei, Jong-I Mou | 2012-07-24 |
| 8108060 | System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architecture | Andy Tsen, Jo Fei Wang, Po-Feng Tsai, Jill Wang, Jong-I Mou +1 more | 2012-01-31 |
| 7977655 | Method and system of monitoring E-beam overlay and providing advanced process control | Jo Fei Wang, Jong-I Mou | 2011-07-12 |
| 6998629 | Reticle position detection system | — | 2006-02-14 |