Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8392009 | Advanced process control with novel sampling policy | Wang Jo Fei, Andy Tsen, Ming-Yu Fan, Jong-I Mou | 2013-03-05 |
| 8108060 | System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architecture | Andy Tsen, Jo Fei Wang, Po-Feng Tsai, Ming-Yu Fan, Jong-I Mou +1 more | 2012-01-31 |