Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8437870 | System and method for implementing a virtual metrology advanced process control platform | Po-Feng Tsai, Jin-Ning Sung | 2013-05-07 |
| 8394719 | System and method for implementing multi-resolution advanced process control | Jin-Ning Sung, Po-Feng Tsai, Jong-I Mou, Yen-Wei Cheng | 2013-03-12 |
| 8396583 | Method and system for implementing virtual metrology in semiconductor fabrication | Po-Feng Tsai, Jo Fei Wang, Jong-I Mou | 2013-03-12 |
| 8392009 | Advanced process control with novel sampling policy | Wang Jo Fei, Ming-Yu Fan, Jill Wang, Jong-I Mou | 2013-03-05 |
| 8239056 | Advanced process control for new tapeout product | Chih-Wei Hsu, Yu-Jen Cheng, Wen-Pin Liu, Shun-Ping Wang, Shin-Rung Lu +3 more | 2012-08-07 |
| 8229588 | Method and system for tuning advanced process control parameters | Chih-Wei Hsu, Ming-Yeon Hung, Ming-Yu Fan, Wang Jo Fei, Jong-I Mou | 2012-07-24 |
| 8224475 | Method and apparatus for advanced process control | Po-Feng Tsai | 2012-07-17 |
| 8219341 | System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) with routing model | Sunny Wu, Wang Jo Fei, Jong-I Mou | 2012-07-10 |
| 8108060 | System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architecture | Jo Fei Wang, Po-Feng Tsai, Ming-Yu Fan, Jill Wang, Jong-I Mou +1 more | 2012-01-31 |
| 8082055 | Method for a bin ratio forecast at new tape out stage | Chun-Hsien Lin, Jui-Long Chen, Sunny Wu, Jong-I Mou, Chia-Hung Huang | 2011-12-20 |
| 8041451 | Method for bin-based control | Sunny Wu, Chih-Sheng Shih, Jo Fei Wang, Jong-I Mou, Hsin Kuan | 2011-10-18 |
| 7951615 | System and method for implementing multi-resolution advanced process control | Jin-Ning Sung, Po-Feng Tsai, Jong-I Mou | 2011-05-31 |