Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161965 | Method of test probe alignment control | Chien-Chih Liao, Chin-Hsiang Lin, Hui-Yun Chao, Jong-I Mou, Tseng Chin Lo +1 more | 2018-12-25 |
| 10083860 | Semiconductor structure with resist protective oxide on isolation structure and method of manufacturing the same | Chen-Liang Liao, Chia-Yao Liang, Sheng Lin, Yi-Lii Huang, Kuo-Hsi Lee +1 more | 2018-09-25 |
| 9633860 | Semiconductor structure with resist protective oxide on isolation structure and method of manufacturing the same | Chen-Liang Liao, Chia-Yao Liang, Sheng Lin, Yi-Lii Huang, Kuo-Hsi Lee +1 more | 2017-04-25 |
| 9165843 | Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes | Hui-Yun Chao, Yen-Di Tsen, Jong-I Mou | 2015-10-20 |
| 9158867 | 2D/3D analysis for abnormal tools and stages diagnosis | Chun-Hsien Lin, Hui-Yun Chao, Jong-I Mou, Chin-Hsiang Lin | 2015-10-13 |
| 9000798 | Method of test probe alignment control | Chien-Chih Liao, Tseng Chin Lo, Hui-Yun Chao, Ta-Yung Lee, Jong-I Mou +1 more | 2015-04-07 |
| 8942840 | Auto device skew manufacturing | Hui-Yun Chao, Chia-Tong Ho | 2015-01-27 |
| 8938698 | Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes | Hui-Yun Chao, Yen-Di Tsen, Jong-I Mou | 2015-01-20 |
| 8627251 | Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes | Hui-Yun Chao, Yen-Di Tsen, Jong-I Mou | 2014-01-07 |
| 8406912 | System and method for data mining and feature tracking for fab-wide prediction and control | Chia-Tong Ho, Po-Feng Tsai, Hui-Yun Chao, Jong-I Mou | 2013-03-26 |
| 8391999 | Auto device skew manufacturing | Hui-Yun Chao, Chia-Tong Ho | 2013-03-05 |
| 8082055 | Method for a bin ratio forecast at new tape out stage | Chun-Hsien Lin, Andy Tsen, Sunny Wu, Jong-I Mou, Chia-Hung Huang | 2011-12-20 |