Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10047439 | Method and system for tool condition monitoring based on a simulated inline measurement | Po-Feng Tsai, Chia-Tong Ho, Jo Fei Wang, Jong-I Mou, Chin-Hsiang Lin | 2018-08-14 |
| 9698065 | Real-time calibration for wafer processing chamber lamp modules | Chih-Tien Chang, Jo Fei Wang, Jong-I Mou, Chin-Hsiang Lin | 2017-07-04 |
| 9519285 | Systems and associated methods for tuning processing tools | Po-Feng Tsai, Chia-Tong Ho, Jo Fei Wang, Jong-I Mou, Chin-Hsiang Lin | 2016-12-13 |
| 9349660 | Integrated circuit manufacturing tool condition monitoring system and method | Po-Feng Tsai, Chia-Tong Ho, Jo Fei Wang, Jong-I Mou, Chin-Hsiang Lin | 2016-05-24 |
| 9159597 | Real-time calibration for wafer processing chamber lamp modules | Chih-Tien Chang, Jo Fei Wang, Jong-I Mou, Chin-Hsiang Lin | 2015-10-13 |
| 9158301 | Semiconductor processing dispatch control | Yen-Di Tsen, Chun-Hsien Lin, Keung Hui, Jo Fei Wang, Jong-I Mou | 2015-10-13 |
| 9141097 | Adaptive and automatic determination of system parameters | Po-Feng Tsai, Chia-Tong Ho, Jo Fei Wang, Jong-I Mou | 2015-09-22 |
| 8781614 | Semiconductor processing dispatch control | Yen-Di Tsen, Chun-Hsien Lin, Keung Hui, Jo Fei Wang, Jong-I Mou | 2014-07-15 |
| 8685759 | E-chuck with automated clamped force adjustment and calibration | Jo Fei Wang, Jong-I Mou | 2014-04-01 |
| 8606387 | Adaptive and automatic determination of system parameters | Po-Feng Tsai, Chia-Tong Ho, Jo Fei Wang, Jong-I Mou | 2013-12-10 |
| 8452439 | Device performance parmeter tuning method and system | Chun-Hsien Lin, Kun-Ming Chen, Dung-Yian Hsieh, Hui-Ru Lin, Jo Fei Wang +2 more | 2013-05-28 |
| 8295965 | Semiconductor processing dispatch control | Yen-Di Tsen, Chun-Hsien Lin, Keung Hui, Jo Fei Wang, Jong-I Mou | 2012-10-23 |
| 8219341 | System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) with routing model | Andy Tsen, Wang Jo Fei, Jong-I Mou | 2012-07-10 |
| 8205173 | Physical failure analysis guiding methods | Yen-Di Tsen, Monghsung Chuang, Fu-Min Huang, Jo Fei Wang, Jong-I Mou | 2012-06-19 |
| 8108060 | System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architecture | Andy Tsen, Jo Fei Wang, Po-Feng Tsai, Ming-Yu Fan, Jill Wang +1 more | 2012-01-31 |
| 8082055 | Method for a bin ratio forecast at new tape out stage | Chun-Hsien Lin, Andy Tsen, Jui-Long Chen, Jong-I Mou, Chia-Hung Huang | 2011-12-20 |
| 8041451 | Method for bin-based control | Chih-Sheng Shih, Andy Tsen, Jo Fei Wang, Jong-I Mou, Hsin Kuan | 2011-10-18 |
| 7851233 | E-chuck for automated clamped force adjustment and calibration | Jo Fei Wang, Jong-I Mou | 2010-12-14 |
| 7354623 | Surface modification of a porous organic material through the use of a supercritical fluid | Ching-Ya Wang, Ping Chuang, Yu-Liang Lin, Hung-Jung Tu, Mei Sheng Zhou +1 more | 2008-04-08 |
| 7144297 | Method and apparatus to enable accurate wafer prediction | Chun-Hsien Lin, Ping-Hsu Chen, Francis Ko | 2006-12-05 |
| 7083495 | Advanced process control approach for Cu interconnect wiring sheet resistance control | Chun-Hsien Lin, Ai-Sen Liu, Yu-Liang Lin, Henry Lo, Mei Sheng Zhou | 2006-08-01 |
| 6843264 | Multi-phase pressure control valve for process chamber | Chih-Tien Chang, Hsueh-Chang Wu, Chien-Ling Huang, Chin-Hsin Peng, Mei-Seng Zhou | 2005-01-18 |
| D328289 | Laptop computer | — | 1992-07-28 |
| 5016849 | Swivel mechanism for a monitor of a laptop computer | — | 1991-05-21 |