Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11324101 | Active fluid static elimination system | Chien-Kuo Lu, Hsao-Szu Chang | 2022-05-03 |
| 11203451 | Multifunction cap replacement module | Chien-Kuo Lu, Chi-Yuan Pung, Chi-Ta Yeh, Hsao-Szu Chang | 2021-12-21 |
| 11027965 | Cap rotation device | Chien-Kuo Lu, Chi-Yuan Pung, Chi-Ta Yeh, Hsao-Szu Chang | 2021-06-08 |
| 11022018 | Exhaust system and method of using | Wei Chang Cheng, Chi-Hung Liao, T. S. Lo, Yung-Yao Lee | 2021-06-01 |
| 10964744 | Light control for improved near infrared sensitivity and channel separation | Cheng Zhao, Chen Lu, Cunyu Yang, Zhiqiang Lin, Chengming Liu | 2021-03-30 |
| 10473021 | Exhaust system and method of using | Wei Chang Cheng, Chi-Hung Liao, T. S. Lo, Yung-Yao Lee | 2019-11-12 |
| 10425597 | Combined visible and infrared image sensor incorporating selective infrared optical filter | Chen Lu, Yin Qian, Eiichi Funatsu | 2019-09-24 |
| 9781362 | Flare-reducing imaging system and associated image sensor | Chao-Hung Lin, Hong Li, Denis Chu | 2017-10-03 |
| 9667933 | Color and infrared filter array patterns to reduce color aliasing | Donghui Wu | 2017-05-30 |
| 8682466 | Automatic virtual metrology for semiconductor wafer result prediction | Francis Ko, Chih-Wei Lai, Kewei Zuo, Henry Lo, Jean Wang +2 more | 2014-03-25 |
| 8409993 | Method and system for controlling copper chemical mechanical polish uniformity | Francis Ko, Chun-Hsien Lin, Jean Wang, Chih-Wei Lai, Henry Lo | 2013-04-02 |
| 7634325 | Prediction of uniformity of a wafer | Jean Wang, Francis Ko, Henry Lo, Chih-Wei Lai | 2009-12-15 |
| 7144297 | Method and apparatus to enable accurate wafer prediction | Chun-Hsien Lin, Sunny Wu, Francis Ko | 2006-12-05 |
| 6926584 | Dual mode hybrid control and method for CMP slurry | Chao-Jung Chang, Chin-Hsin Peng, Jui-Cheng Lo, Chien-Kuo Lu, Chien-Ling Huang | 2005-08-09 |
| 6884149 | Method and system for in-situ monitoring of mixing ratio of high selectivity slurry | Shang-Ting Tsai, Ping Chuang, Henry Lo, Chao-Jung Chang, Yu-Liang Lin +3 more | 2005-04-26 |
| 6729935 | Method and system for in-situ monitoring of mixing ratio of high selectivity slurry | Shang-Ting Tsai, Ping Chuang, Henry Lo, Chao-Jung Chang, Yu-Liang Lin +3 more | 2004-05-04 |