JW

Jean Wang

TSMC: 27 patents #1,273 of 12,232Top 15%
NU National Formosa University: 1 patents #27 of 129Top 25%
📍 Douliu, TW: #10 of 282 inventorsTop 4%
Overall (All Time): #135,502 of 4,157,543Top 4%
28
Patents All Time

Issued Patents All Time

Showing 1–25 of 28 patents

Patent #TitleCo-InventorsDate
12384569 UAV having multifunctional leg assembly and its charging system Jie Zou 2025-08-12
9177843 Preventing contamination in integrated circuit manufacturing lines Chien-Ming Sung, Simon Wang, Jia-Ren Chen, Henry Lo, Chen-Hua Yu +1 more 2015-11-03
9093447 Chip on wafer bonder Chen-Hua Yu, Jui-Pin Hung, Weng-Jin Wu, Wen-Chih Chiou 2015-07-28
9037279 Clustering for prediction models in process control and for optimal dispatching Francis Ko, Tzu-Yu Wang, Kewei Zuo, Henry Lo, Chih-Wei Lai 2015-05-19
8827695 Wafer's ambiance control Yi-Li Hsiao, Chen-Hua Yu, Ming-Che Ho, Chien Ling Hwang, Jui-Pin Hung 2014-09-09
8795486 PVD target with end of service life detection capability Yi-Li Hsiao, Jerry Hwang, Jyh-Cherng Sheu, Lawrance Sheu, Chen-Hua Yu 2014-08-05
8682466 Automatic virtual metrology for semiconductor wafer result prediction Francis Ko, Chih-Wei Lai, Kewei Zuo, Henry Lo, Ping-Hsu Chen +2 more 2014-03-25
8433434 Near non-adaptive virtual metrology and chamber control Amy Wang, Chen-Hua Yu, Henry Lo, Francis Ko, Chih-Wei Lai +1 more 2013-04-30
8409993 Method and system for controlling copper chemical mechanical polish uniformity Francis Ko, Chun-Hsien Lin, Chih-Wei Lai, Ping-Hsu Chen, Henry Lo 2013-04-02
8387674 Chip on wafer bonder Chen-Hua Yu, Jui-Pin Hung, Weng-Jin Wu, Wen-Chih Chiou 2013-03-05
8276648 PVD target with end of service life detection capability Yi-Li Hsiao, Chen-Hua Yu, Lawrance Sheu 2012-10-02
8172641 CMP by controlling polish temperature Ming-Che Ho, Lawrence Chiang Sheu 2012-05-08
8145337 Methodology to enable wafer result prediction of semiconductor wafer batch processing equipment Chun-Hsien Lin, Amy Wang, Francis Ko 2012-03-27
8133097 Polishing apparatus Yu-Liang Lin, Chien Ling Hwang, Chen-Hua Yu 2012-03-13
8109407 Apparatus for storing substrates Yi-Li Hsiao, Chen-Hua Yu, Jui-Pin Hung, Ming-Shih Yeh 2012-02-07
8101052 Adjustable anode assembly for a substrate wet processing apparatus Yi-Li Hsiao, Chen-Hua Yu, Lawrance Sheu 2012-01-24
7974728 System for extraction of key process parameters from fault detection classification to enable wafer prediction Chun-Hsien Lin, Francis Ko, Kewei Zuo, Henry Lo 2011-07-05
7956448 Stacked structures and methods of fabricating stacked structures Chen-Hua Yu, Wen-Chih Chiou, Weng-Jin Wu 2011-06-07
7951723 Integrated etch and supercritical CO2 process and chamber design Ching-Ya Wang, Weng-Jin Wu, Henry Lo 2011-05-31
7891536 PVD target with end of service life detection capability Yi-Li Hsiao, Chen-Hua Yu, Lawrance Sheu 2011-02-22
7879711 Stacked structures and methods of fabricating stacked structures Chen-Hua Yu, Wen-Chih Chiou, Weng-Jin Wu 2011-02-01
7851234 System and method for enhanced control of copper trench sheet resistance uniformity Francis Ko, Henry Lo, Chi-Chun Hsieh, Amy Wang 2010-12-14
7829815 Adjustable electrodes and coils for plasma density distribution control Ying Chen, Chi-An Kao, Po-Zen Chen, Yi-Li Hsiao, Chen-Hua Yu +1 more 2010-11-09
7767471 Auto routing for optimal uniformity control Francis Ko, Henry Lo, Chi-Chun Hsieh, Amy Wang, Chih-Wei Lai +1 more 2010-08-03
7758338 Substrate carrier, port apparatus and facility interface and apparatus including same Yi-Li Hsiao, Chen-Hua Yu, Fu-Kang Tien, Jui-Pin Hung 2010-07-20