Issued Patents All Time
Showing 151–175 of 468 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7829853 | Sample surface observation method | Masahiro Hatakeyama, Yoshihiko Naito, Kenji Terao | 2010-11-09 |
| 7811909 | Production of a hexagonal boron nitride crystal body capable of emitting out ultraviolet radiation | Takashi Taniguchi, Yoichi Kubota, Osamu Tsuda | 2010-10-12 |
| 7754151 | Liquid homogenizer and analyzer employing the same | Fumihisa Kitawaki, Hirotaka Tanaka | 2010-07-13 |
| 7745784 | Electron beam apparatus and method of manufacturing semiconductor device using the apparatus | Mamoru Nakasuji, Tohru Satake, Takeshi Murakami, Nobuharu Noji, Hirosi Sobukawa +9 more | 2010-06-29 |
| 7741601 | Testing apparatus using charged particles and device manufacturing method using the testing apparatus | Nobuharu Noji, Tohru Satake, Hirosi Sobukawa, Toshifumi Kimba, Masahiro Hatakeyama +7 more | 2010-06-22 |
| 7728895 | Solid-state image sensing device having shared floating diffusion portions | Shouzi Tanaka, Ryouhei Miyagawa, Kazunari Koga, Takahiro Muroshima | 2010-06-01 |
| 7705831 | Pad type input device and scroll controlling method using the same | Kazuhito Ohshita, Yoshiyuki Kikuchi, Shoji Suzuki | 2010-04-27 |
| 7671317 | Physical quantity detecting apparatus and method for driving the same | Kenichi Shimomura, Yutaka Abe | 2010-03-02 |
| 7661333 | Rotation transmission member and manufacturing method therefor | — | 2010-02-16 |
| 7652702 | Solid state imaging device and imaging device | Masashi Murakami, Masayuki Hirota | 2010-01-26 |
| 7643138 | Method of inspecting a semiconductor device and an apparatus thereof | Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka +4 more | 2010-01-05 |
| 7633490 | Input device | Kazuhito Ohshita, Akihisa Ito, Yoshiyuki Kikuchi, Shoji Suzuki | 2009-12-15 |
| 7592586 | Mapping-projection-type electron beam apparatus for inspecting sample by using electrons reflected from the sample | Takeshi Murakami, Masahiro Hatakeyama, Yoshinao Hirabayashi, Tohru Satake, Nobuharu Noji +2 more | 2009-09-22 |
| D600599 | Air cleaner cover for a motorcycle | Daisuke Nagao, Ramon Meneses | 2009-09-22 |
| 7593837 | Plant operation support system | Makoto Nakaya, Gentaro Fukano, Tetsuya Ohtani | 2009-09-22 |
| 7569838 | Electron beam inspection system and inspection method and method of manufacturing devices using the system | Hirosi Sobukawa, Nobuharu Noji, Tohru Satake, Shoji Yoshikawa, Tsutomu Karimata +7 more | 2009-08-04 |
| 7556450 | Water collecting structure and drainage structure using the same | Masahiro Shimono | 2009-07-07 |
| 7537436 | Compressor | Takeo Kitamura, Takeshi Kawata, Okuzono Kenji, Tsuchida Nobunao | 2009-05-26 |
| 7521692 | TDI detecting device, a feed-through equipment, an electron beam apparatus using these device and equipment, and a semiconductor device manufacturing method using the same electron beam apparatus | Masahiro Hatakeyama, Tohru Satake, Takeshi Murakami, Nobuharu Noji | 2009-04-21 |
| 7499162 | Method and apparatus for observing and inspecting defects | Yukihiro Shibata, Shunji Maeda, Kazuo Yamaguchi, Minoru Yoshida, Atsushi Yoshida +1 more | 2009-03-03 |
| 7490541 | Compressor | Takeshi Kawata, Kenji Okuzono, Nobunao Tsuchida | 2009-02-17 |
| 7483560 | Method for measuring three dimensional shape of a fine pattern | Chle Shishido, Ryo Nakagaki, Maki Tanaka, Yuya Toyoshima | 2009-01-27 |
| 7479634 | Electron beam apparatus and device manufacturing method using the same | Mamoru Nakasuji, Takao Kato, Shoji Yoshikawa, Tohru Satake, Nobuharu Noji | 2009-01-20 |
| 7476856 | Sample dimension-measuring method and charged particle beam apparatus | Tadashi Otaka, Ryo Nakagaki, Chie Shishido, Masakazu Takahashi, Yuya Toyoshima | 2009-01-13 |
| PP19621 | Pachysandra plant named ‘Hakurei’ | — | 2009-01-06 |