Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8124933 | Mapping-projection-type electron beam apparatus for inspecting sample by using electrons emitted from the sample | Kenji Watanabe, Takeshi Murakami, Masahiro Hatakeyama, Tohru Satake, Nobuhara Noji +2 more | 2012-02-28 |
| 7592586 | Mapping-projection-type electron beam apparatus for inspecting sample by using electrons reflected from the sample | Kenji Watanabe, Takeshi Murakami, Masahiro Hatakeyama, Tohru Satake, Nobuharu Noji +2 more | 2009-09-22 |