TL

Thomas J. Licata

IBM: 14 patents #8,004 of 70,183Top 15%
TL Tokyo Electron Limited: 10 patents #748 of 5,567Top 15%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
Overall (All Time): #165,724 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6730605 Redistribution of copper deposited films Chantal Arena-Foster, Robert F. Foster, Joseph T. Hillman, Tugrul Yasar 2004-05-04
6508919 Optimized liners for dual damascene metal wiring Joseph T. Hillman 2003-01-21
6395095 Process apparatus and method for improved plasma processing of a substrate William Jones, Robert Rowan, Edward L. Sill 2002-05-28
6224724 Physical vapor processing of a surface with non-uniformity compensation Steven Hurwitt 2001-05-01
6214720 Plasma process enhancement through reduction of gaseous contaminants Edward L. Sill 2001-04-10
6200894 Method for enhancing aluminum interconnect properties Katsuya Okumura, Kenneth P. Rodbell 2001-03-13
6197165 Method and apparatus for ionized physical vapor deposition John Drewery 2001-03-06
6132564 In-situ pre-metallization clean and metallization of semiconductor wafers 2000-10-17
6117279 Method and apparatus for increasing the metal ion fraction in ionized physical vapor deposition Jason Smolanoff, Doug Caldwell, Jim Zibrida, Bruce Gittleman 2000-09-12
6110824 Wire shape conferring reduced crosstalk and formation methods Jack A. Mandelman 2000-08-29
6080287 Method and apparatus for ionized physical vapor deposition John Drewery 2000-06-27
5885425 Method for selective material deposition on one side of raised or recessed features Julian Hsieh, Donald M. Kenney, James G. Ryan 1999-03-23
5874201 Dual damascene process having tapered vias Ronald W. Nunes, Motoya Okazaki 1999-02-23
5800688 Apparatus for ionized sputtering Alexander D. Lantsman 1998-09-01
5796166 Tasin oxygen diffusion barrier in multilayer structures Paul D. Agnello, Cyril Cabral, Jr., Alfred Grill, Christopher V. Jahnes, Ronnen Andrew Roy 1998-08-18
5776823 Tasin oxygen diffusion barrier in multilayer structures Paul D. Agnello, Cyril Cabral, Jr., Alfred Grill, Christopher V. Jahnes, Ronnen Andrew Roy 1998-07-07
5766968 Micro mask comprising agglomerated material Michael D. Armacost, A. Richard Baker, Jr., Wayne S. Berry, Daniel Carl, Donald McAllpine Kenney 1998-06-16
5757879 Tungsten absorber for x-ray mask Rajiv V. Joshi, Kurt R. Kimmel, James G. Ryan 1998-05-26
5726498 Wire shape conferring reduced crosstalk and formation methods Jack A. Mandelman 1998-03-10
5711858 Process for depositing a conductive thin film upon an integrated circuit substrate Richard S. Kontra, James G. Ryan, Timothy D. Sullivan 1998-01-27
5576579 Tasin oxygen diffusion barrier in multilayer structures Paul D. Agnello, Cyril Cabral, Jr., Alfred Grill, Christopher V. Jahnes, Ronnen Andrew Roy 1996-11-19
5545590 Conductive rie-resistant collars for studs beneath rie-defined wires 1996-08-13
5466626 Micro mask comprising agglomerated material Michael D. Armacost, A. Richard Baker, Jr., Wayne S. Berry, Daniel Carl, Donald McAllpine Kenney 1995-11-14
5401675 Method of depositing conductors in high aspect ratio apertures using a collimator Pei-Ing Lee, Thomas L. McDevitt, Paul C. Parries, Scott L. Pennington, James G. Ryan +1 more 1995-03-28
5356837 Method of making epitaxial cobalt silicide using a thin metal underlayer Peter J. Geiss, Herbert L. Ho, James G. Ryan 1994-10-18