Issued Patents All Time
Showing 26–50 of 57 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9489482 | Reliability-optimized selective voltage binning | Jeanne P. Bickford, Baozhen Li, Tad J. Wilder | 2016-11-08 |
| 9430603 | Scaling voltages in relation to die location | Eric A. Foreman, Kerim Kalafala | 2016-08-30 |
| 9395403 | Optimization of integrated circuit reliability | Carole D. Graas, Deborah M. Massey, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more | 2016-07-19 |
| 9354953 | System integrator and system integration method with reliability optimized integrated circuit chip selection | Jeanne P. Bickford, Baozhen Li | 2016-05-31 |
| 9202554 | Methods and circuits for generating physically unclonable function | Albert M. Chu, Daryl M. Seitzer, Rohit Shetty | 2015-12-01 |
| 9117045 | System and method to predict chip IDDQ and control leakage components | Jeanne P. Spence Bickford, Robert McMahon | 2015-08-25 |
| 9082875 | Methods for normalizing strain in semicondcutor devices and strain normalized semiconductor devices | Bruce Balch, Kerry Bernstein, John J. Ellis-Monaghan | 2015-07-14 |
| 9064087 | Semiconductor device reliability model and methodologies for use thereof | Jeanne P. Bickford, Baozhen Li, Pascal A. Nsame | 2015-06-23 |
| 9058250 | In-situ computing system failure avoidance | Jeanne P. Bickford, Baozhen Li, Pascal A. Nsame | 2015-06-16 |
| 8949767 | Reliability evaluation and system fail warning methods using on chip parametric monitors | Jeanne P. Bickford, John R. Goss, Robert McMahon | 2015-02-03 |
| 8943444 | Semiconductor device reliability model and methodologies for use thereof | Jeanne P. Bickford, Baozhen Li, Pascal A. Nsame | 2015-01-27 |
| 8521500 | Method and device for measuring integrated circuit power supply noise and calibration of power supply noise analysis models | Igor Arsovski, Bruce Balch, Umberto Garofano | 2013-08-27 |
| 8504975 | Reliability evaluation and system fail warning methods using on chip parametric monitors | Jeanne P. Bickford, John R. Goss, Robert McMahon | 2013-08-06 |
| 8421495 | Speed binning for dynamic and adaptive power control | Theodoros E. Anemikos, Jeanne P. Bickford, Susan K. Lichtensteiger | 2013-04-16 |
| 8298876 | Methods for normalizing strain in semiconductor devices and strain normalized semiconductor devices | Bruce Balch, Kerry Bernstein, John J. Ellis-Monaghan | 2012-10-30 |
| 8120356 | Measurement methodology and array structure for statistical stress and test of reliabilty structures | Kanak B. Agarwal, Jerry D. Hayes, John G. Massey, Alvin W. Strong | 2012-02-21 |
| 8114686 | Phase change material based temperature sensor | Chung H. Lam, Robert McMahon | 2012-02-14 |
| 8095907 | Reliability evaluation and system fail warning methods using on chip parametric monitors | Jeanne P. Bickford, John R. Goss, Robert McMahon | 2012-01-10 |
| 8055822 | Multicore processor having storage for core-specific operational data | Kerry Bernstein, Norman J. Rohrer | 2011-11-08 |
| 8020138 | Voltage island performance/leakage screen monitor for IP characterization | Bruce Balch, Susan K. Lichtensteiger, Daniel Stasiak, Richard A. Wachnik | 2011-09-13 |
| 7917451 | Methods, apparatus, and program products to optimize semiconductor product yield prediction for performance and leakage screens | Thomas S. Barnett, Jeanne P. Bickford, Susan K. Lichtensteiger, Raymond J. Rosner | 2011-03-29 |
| 7884599 | HDL design structure for integrating test structures into an integrated circuit design | Robert McMahon, Troy J. Perry | 2011-02-08 |
| 7882455 | Circuit and method using distributed phase change elements for across-chip temperature profiling | Mark C. H. Lamorey, Thomas M. Maffitt, Robert McMahon | 2011-02-01 |
| 7868640 | Array-based early threshold voltage recovery characterization measurement | Kanak B. Agarwal, Jerry D. Hayes, John G. Massey, Alvin W. Strong | 2011-01-11 |
| 7803644 | Across reticle variation modeling and related reticle | Bruce Balch, Jeanne P. Bickford, Phung T. Nguyen | 2010-09-28 |