Issued Patents All Time
Showing 51–57 of 57 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7795605 | Phase change material based temperature sensor | Chung H. Lam, Robert McMahon | 2010-09-14 |
| 7656182 | Testing method using a scalable parametric measurement macro | Jeanne P. Bickford, John R. Goss, Robert McMahon | 2010-02-02 |
| 7653888 | System for and method of integrating test structures into an integrated circuit | Robert McMahon, Troy J. Perry | 2010-01-26 |
| 7560946 | Method of acceptance for semiconductor devices | Jeanne P. Bickford, John R. Goss, Robert McMahon | 2009-07-14 |
| 7512915 | Embedded test circuit for testing integrated circuits at the die level | Darren L. Anand, Robert McMahon, Troy J. Perry | 2009-03-31 |
| 7487477 | Parametric-based semiconductor design | Jeanne P. Bickford, John R. Goss, Robert McMahon | 2009-02-03 |
| 7382149 | System for acquiring device parameters | Darren L. Anand, Robert McMahon, Troy J. Perry | 2008-06-03 |