JM

Jack A. Mandelman

IBM: 439 patents #33 of 70,183Top 1%
Infineon Technologies Ag: 27 patents #440 of 7,486Top 6%
SA Siemens Aktiengesellschaft: 18 patents #396 of 22,248Top 2%
KT Kabushiki Kaisha Toshiba: 4 patents #6,684 of 21,451Top 35%
SM Siemens Microelectronics: 2 patents #2 of 40Top 5%
SC Siemens Components: 1 patents #6 of 30Top 20%
📍 Underhill, VT: #1 of 98 inventorsTop 2%
🗺 Vermont: #4 of 4,968 inventorsTop 1%
Overall (All Time): #503 of 4,157,543Top 1%
440
Patents All Time

Issued Patents All Time

Showing 151–175 of 440 patents

Patent #TitleCo-InventorsDate
7026202 Inverse-T gate structure using damascene processing Carl Radens, William R. Tonti 2006-04-11
7023041 Trench capacitor vertical structure Giuseppe La Rosa, Thomas W. Dyer, Oleg Gluschenkov, Carl Radens, Alvin W. Strong 2006-04-04
6979851 Structure and method of vertical transistor DRAM cell having a low leakage buried strap Dureseti Chidambarrao, Carl Radens 2005-12-27
6974743 Method of making encapsulated spacers in vertical pass gate DRAM and damascene logic gates Ramac Divakaruni, Stephan Kudelka 2005-12-13
6972220 Structures and methods of anti-fuse formation in SOI Claude L. Bertin, Ramachandra Divakaruni, Russell J. Houghton, William R. Tonti 2005-12-06
6967137 Forming collar structures in deep trench capacitors with thermally stable filler material Michael P. Belyansky, Rama Divakaruni, Dae-Gyu Park 2005-11-22
6911687 Buried bit line-field isolation defined active semiconductor areas Gerhard Kunkel 2005-06-28
6909137 Method of creating deep trench capacitor using a P+ metal electrode Ramachandra Divakaruni, Dae-Gyu Park 2005-06-21
6897107 Method for forming TTO nitride liner for improved collar protection and TTO reliability Rama Divakaruni, Thomas W. Dyer, Rajeev Malik, Venkatachajam C. Jaiprakash 2005-05-24
6872620 Trench capacitors with reduced polysilicon stress Dureseti Chidambarrao, Rajarao Jammy 2005-03-29
6869846 Forming electronic structures having dual dielectric thicknesses and the structure so formed Louis L. Hsu, Carl Radens, Richard Strub, William R. Tonti 2005-03-22
6833305 Vertical DRAM punchthrough stop self-aligned to storage trench Dureseti Chidambarrao, Ramachandra Divakaruni 2004-12-21
6831006 Structure and method for eliminating metal contact to P-well or N-well shorts or high leakage paths using polysilicon liner Ramachandra Divakaruni, Haining Yang 2004-12-14
6818487 Self-aligned, planarized thin-film transistors, devices employing the same, and methods of fabrication thereof Louis L. Hsu, William R. Tonti, Li-Kong Wang 2004-11-16
6818528 Method for multi-depth trench isolation Ramachandra Divakaruni 2004-11-16
6815749 Backside buried strap for SOI DRAM trench capacitor Herbert L. Ho 2004-11-09
6809372 Flash memory structure using sidewall floating gate Jeffrey P. Gambino, Louis L. Hsu, Donald C. Wheeler 2004-10-26
6808981 Method for fabricating 6F2 trench DRAM cell with double-gated vertical MOSFET and self-aligned STI Ramachandra Divakaruni, Carl Radens, Gary B. Bronner 2004-10-26
6809368 TTO nitride liner for improved collar protection and TTO reliability Rama Divakaruni, Thomas W. Dyer, Rajeev Malik, Venkatachalam C. Jaiprakash 2004-10-26
6790722 Logic SOI structure, process and application for vertical bipolar transistor Ramachandra Divakaruni, Russell J. Houghton, Wilbur D. Pricer, William R. Tonti 2004-09-14
6777733 Method for forming dual workfunction high-performance support MOSFETs in EDRAM arrays Ramachandra Divakaruni, Carl Radens 2004-08-17
6777737 Vertical DRAM punchthrough stop self-aligned to storage trench Dureseti Chidambarrao, Ramachandra Divakaruni 2004-08-17
6767789 Method for interconnection between transfer devices and storage capacitors in memory cells and device formed thereby Gary B. Bronner, David V. Horak, Toshiharu Furukawa 2004-07-27
6762447 Field-shield-trench isolation for gigabit DRAMs Rama Divakaruni, Giuseppe Larosa, Ulrike Gruening, Carl Radens 2004-07-13
6759291 Self-aligned near surface strap for high density trench DRAMS Ramachandra Divakaruni, Jochen Beintner, Ulrike Gruening, Johann Alsmeier, Gary B. Bronner 2004-07-06