Issued Patents All Time
Showing 776–800 of 826 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6888221 | BICMOS technology on SIMOX wafers | Alvin J. Joseph, Qizhi Liu | 2005-05-03 |
| 6884667 | Field effect transistor with stressed channel and method for making same | Bruce B. Doris, Dureseti Chidambarrao, Xavier Baie, Jack A. Mandelman, Dominic J. Schepis | 2005-04-26 |
| 6878611 | Patterned strained silicon for high performance circuits | Stephen W. Bedell, Tze-Chiang Chen, Kwang Su Choe, Keith E. Fogel | 2005-04-12 |
| 6875982 | Electron microscope magnification standard providing precise calibration in the magnification range 5000X-2000,000X | Stephen W. Bedell, John Bruley, Anthony G. Domenicucci | 2005-04-05 |
| 6861158 | Formation of silicon-germanium-on-insulator (SGOI) by an integral high temperature SIMOX-Ge interdiffusion anneal | Stephen W. Bedell, Joel P. de Souza, Keith E. Fogel, Ghavam G. Shahidi | 2005-03-01 |
| 6855436 | Formation of silicon-germanium-on-insulator (SGOI) by an integral high temperature SIMOX-Ge interdiffusion anneal | Stephen W. Bedell, Keith E. Fogel, Ghavam G. Shahidi | 2005-02-15 |
| 6846727 | Patterned SOI by oxygen implantation and annealing | Keith E. Fogel, Mark C. Hakey, Steven J. Holmes, Ghavam G. Shahidi | 2005-01-25 |
| 6841457 | Use of hydrogen implantation to improve material properties of silicon-germanium-on-insulator material made by thermal diffusion | Stephen W. Bedell, Keith E. Fogel | 2005-01-11 |
| 6835983 | Silicon-on-insulator (SOI) integrated circuit (IC) chip with the silicon layers consisting of regions of different thickness | Tak H. Ning | 2004-12-28 |
| 6825102 | Method of improving the quality of defective semiconductor material | Stephen W. Bedell, Keith E. Fogel, Shreesh Narasimha | 2004-11-30 |
| 6812114 | Patterned SOI by formation and annihilation of buried oxide regions during processing | Tze-Chiang Chen | 2004-11-02 |
| 6805962 | Method of creating high-quality relaxed SiGe-on-insulator for strained Si CMOS applications | Stephen W. Bedell, Jack O. Chu, Keith E. Fogel, Steven J. Koester, John A. Ott | 2004-10-19 |
| 6803240 | Method of measuring crystal defects in thin Si/SiGe bilayers | Stephen W. Bedell, Keith E. Fogel | 2004-10-12 |
| 6800518 | Formation of patterned silicon-on-insulator (SOI)/silicon-on-nothing (SON) composite structure by porous Si engineering | Robert E. Bendernagel, Kwang Su Choe, Bijan Davari, Keith E. Fogel, Ghavam G. Shahidi +1 more | 2004-10-05 |
| 6784072 | Control of buried oxide in SIMOX | Stephen Fox, Neena Garg, Kenneth J. Giewont, Junedong Lee, Siegfried Maurer +2 more | 2004-08-31 |
| 6756639 | Control of buried oxide quality in low dose SIMOX | Maurice Heathcote Norcott | 2004-06-29 |
| 6756257 | Patterned SOI regions on semiconductor chips | Bijan Davari, Ghavam G. Shahidi, Sandip Tiwari | 2004-06-29 |
| 6743651 | Method of forming a SiGe-on-insulator substrate using separation by implantation of oxygen | Jack O. Chu, Feng-Yi Huang, Steven J. Koester | 2004-06-01 |
| 6717216 | SOI based field effect transistor having a compressive film in undercut area under the channel and a method of making the device | Bruce B. Doris, Dureseti Chidambarrao, Xavier Baie, Jack A. Mandelman, Dominic J. Schepis | 2004-04-06 |
| 6717217 | Ultimate SIMOX | Keith E. Fogel, Maurice Heathcote Norcott | 2004-04-06 |
| 6657261 | Ground-plane device with back oxide topography | Fariborz Assaderaghi, Tze-Chiang Chen, K. Paul Muller, Edward J. Nowak, Ghavam G. Shahidi | 2003-12-02 |
| 6642090 | Fin FET devices from bulk semiconductor and method for forming | David M. Fried, Edward J. Nowak, Beth Ann Rainey | 2003-11-04 |
| 6602757 | Self-adjusting thickness uniformity in SOI by high-temperature oxidation of SIMOX and bonded SOI | Harold J. Hovel | 2003-08-05 |
| 6593205 | Patterned SOI by formation and annihilation of buried oxide regions during processing | Tze-Chiang Chen | 2003-07-15 |
| 6566177 | Silicon-on-insulator vertical array device trench capacitor DRAM | Carl Radens, Gary B. Bronner, Tze-Chiang Chen, Bijan Davari, Jack A. Mandelman +3 more | 2003-05-20 |