Issued Patents All Time
Showing 1–25 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7538565 | High density integrated circuit apparatus, test probe and methods of use thereof | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih, George F. Walker | 2009-05-26 |
| 7492008 | Control of buried oxide in SIMOX | Stephen Fox, Neena Garg, Kenneth J. Giewont, Junedong Lee, Siegfried Maurer +2 more | 2009-02-17 |
| 7332922 | Method for fabricating a structure for making contact with a device | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih | 2008-02-19 |
| 7276919 | High density integral test probe | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih, George F. Walker | 2007-10-02 |
| 6880245 | Method for fabricating a structure for making contact with an IC device | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih | 2005-04-19 |
| 6784072 | Control of buried oxide in SIMOX | Stephen Fox, Neena Garg, Kenneth J. Giewont, Junedong Lee, Siegfried Maurer +2 more | 2004-08-31 |
| 6756639 | Control of buried oxide quality in low dose SIMOX | Devendra K. Sadana | 2004-06-29 |
| 6722032 | Method of forming a structure for electronic devices contact locations | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih | 2004-04-20 |
| 6717217 | Ultimate SIMOX | Keith E. Fogel, Devendra K. Sadana | 2004-04-06 |
| 6541356 | Ultimate SIMOX | Keith E. Fogel, Devendra K. Sadana | 2003-04-01 |
| 6486037 | Control of buried oxide quality in low dose SIMOX | Devendra K. Sadana | 2002-11-26 |
| 6334247 | High density integrated circuit apparatus, test probe and methods of use thereof | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih, George F. Walker | 2002-01-01 |
| 6332270 | Method of making high density integral test probe | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih, George F. Walker | 2001-12-25 |
| 6329827 | High density cantilevered probe for electronic devices | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih | 2001-12-11 |
| 6300780 | High density integrated circuit apparatus, test probe and methods of use thereof | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih, George F. Walker | 2001-10-09 |
| 6286208 | Interconnector with contact pads having enhanced durability | Da-Yuan Shih, Paul A. Lauro, Keith E. Fogel, Brian S. Beaman | 2001-09-11 |
| 6104201 | Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih, George F. Walker | 2000-08-15 |
| 6062879 | High density test probe with rigid surface structure | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih | 2000-05-16 |
| 5914614 | High density cantilevered probe for electronic devices | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih | 1999-06-22 |
| 5838160 | Integral rigid chip test probe | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih, George F. Walker | 1998-11-17 |
| 5821763 | Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih, George F. Walker | 1998-10-13 |
| 5811982 | High density cantilevered probe for electronic devices | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yaun Shih | 1998-09-22 |
| 5810607 | Interconnector with contact pads having enhanced durability | Da-Yuan Shih, Paul A. Lauro, Keith E. Fogel, Brian S. Beaman | 1998-09-22 |
| 5785538 | High density test probe with rigid surface structure | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih | 1998-07-28 |
| 5635846 | Test probe having elongated conductor embedded in an elostomeric material which is mounted on a space transformer | Brian S. Beaman, Keith E. Fogel, Paul A. Lauro, Da-Yuan Shih, George F. Walker | 1997-06-03 |