Issued Patents All Time
Showing 801–825 of 826 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6541356 | Ultimate SIMOX | Keith E. Fogel, Maurice Heathcote Norcott | 2003-04-01 |
| 6495429 | Controlling internal thermal oxidation and eliminating deep divots in SIMOX by chlorine-based annealing | Michael E. Adamcek, Anthony G. Domenicucci, Stephen Fox, Neena Garg, Kenneth J. Giewont +2 more | 2002-12-17 |
| 6486037 | Control of buried oxide quality in low dose SIMOX | Maurice Heathcote Norcott | 2002-11-26 |
| 6432754 | Double SOI device with recess etch and epitaxy | Fariborz Assaderaghi, Tze-Chiang Chen, K. Paul Muller, Edward J. Nowak, Ghavam G. Shahidi | 2002-08-13 |
| 6429488 | Densely patterned silicon-on-insulator (SOI) region on a wafer | Effendi Leobandung, Dominic J. Schepis, Ghavam G. Shahidi | 2002-08-06 |
| 6426252 | Silicon-on-insulator vertical array DRAM cell with self-aligned buried strap | Carl Radens, Gary B. Bronner, Tze-Chiang Chen, Bijan Davari, Jack A. Mandelman +3 more | 2002-07-30 |
| 6404014 | Planar and densely patterned silicon-on-insulator structure | Effendi Leobandung, Dominic J. Schepis, Ghavam G. Shahidi | 2002-06-11 |
| 6333532 | Patterned SOI regions in semiconductor chips | Bijan Davari, Ghavam G. Shahidi, Sandip Tiwari | 2001-12-25 |
| 6300218 | Method for patterning a buried oxide thickness for a separation by implanted oxygen (simox) process | Guy M. Cohen | 2001-10-09 |
| 6259137 | Defect induced buried oxide (DIBOX) for throughput SOI | Joel P. de Souza | 2001-07-10 |
| 6255145 | Process for manufacturing patterned silicon-on-insulator layers with self-aligned trenches and resulting product | Atul Ajmera, Dominic J. Schepis | 2001-07-03 |
| 6222253 | Buried oxide layer in silicon | Orin W. Holland | 2001-04-24 |
| 6214694 | Process of making densely patterned silicon-on-insulator (SOI) region on a wafer | Effendi Leobandung, Dominic J. Schepis, Ghavam G. Shahidi | 2001-04-10 |
| 6204546 | Silicon-on-insulator substrates using low dose implantation | Peter Roitman | 2001-03-20 |
| 6180486 | Process of fabricating planar and densely patterned silicon-on-insulator structure | Effendi Leobandung, Dominic J. Schepis, Ghavam G. Shahidi | 2001-01-30 |
| 6177289 | Lateral trench optical detectors | John D. Crow, Steve Koester, Daniel M. Kuchta, Dennis L. Rogers, Sandip Tiwari | 2001-01-23 |
| 6090689 | Method of forming buried oxide layers in silicon | Orin W. Holland | 2000-07-18 |
| 6087242 | Method to improve commercial bonded SOI material | Humphrey J. Maris | 2000-07-11 |
| 6043166 | Silicon-on-insulator substrates using low dose implantation | Peter Roitman | 2000-03-28 |
| 5930643 | Defect induced buried oxide (DIBOX) for throughput SOI | Joel P. de Souza | 1999-07-27 |
| 5767549 | SOI CMOS structure | Wei Chen, Yuan Taur | 1998-06-16 |
| 5272373 | Internal gettering of oxygen in III-V compound semiconductors | Harve Baratte, Joel P. de Souza | 1993-12-21 |
| 5242859 | Highly doped semiconductor material and method of fabrication thereof | Joseph F. Degelormo, Paul Fahey, Thomas N. Jackson, Craig Ransom | 1993-09-07 |
| 5188978 | Controlled silicon doping of III-V compounds by thermal oxidation of silicon capping layer | Joel P. Desouza, James H. Greiner | 1993-02-23 |
| 5183767 | Method for internal gettering of oxygen in III-V compound semiconductors | Herve Baratte, Joel P. de Souza | 1993-02-02 |