MG

Michael Graf

AT Axcelis Technologies: 18 patents #7 of 300Top 3%
TE Tel Epion: 10 patents #5 of 54Top 10%
EA Eaton: 1 patents #1,900 of 3,708Top 55%
Overall (All Time): #103,115 of 4,157,543Top 3%
34
Patents All Time

Issued Patents All Time

Showing 25 most recent of 34 patents

Patent #TitleCo-InventorsDate
10861674 Compensated location specific processing apparatus and method Matthew C. Gwinn, Martin D. Tabat, Kenneth Regan, Allen J. Leith 2020-12-08
10497540 Compensated location specific processing apparatus and method Matthew C. Gwinn, Martin D. Tabat, Kenneth Regan, Allen J. Leith 2019-12-03
9735019 Process gas enhancement for beam treatment of a substrate Noel Russell, Matthew C. Gwinn, Allen J. Leith 2017-08-15
9103031 Method and system for growing a thin film using a gas cluster ion beam John Hautala, Yan Shao, Brian S. Freer 2015-08-11
8981322 Multiple nozzle gas cluster ion beam system Martin D. Tabat, Matthew C. Gwinn, Robert K. Becker, Avrum Freytsis 2015-03-17
8803110 Methods for beam current modulation by ion source parameter modulation Edward C. Eisner, William F. DiVergilio, Daniel R. Tieger 2014-08-12
8691700 Gas cluster ion beam etch profile control using beam divergence John Hautala 2014-04-08
8338806 Gas cluster ion beam system with rapid gas switching apparatus Robert K. Becker, Christopher T. Reddy, Noel Russell 2012-12-25
8304033 Method of irradiating substrate with gas cluster ion beam formed from multiple gas nozzles Martin D. Tabat, Matthew C. Gwinn, Robert K. Becker, Avrum Freytsis 2012-11-06
8193513 Hybrid ion source/multimode ion source William F. DiVergilio, Daniel R. Tieger 2012-06-05
8173980 Gas cluster ion beam system with cleaning apparatus Andrej Mitrovic 2012-05-08
8097860 Multiple nozzle gas cluster ion beam processing system and method of operating Martin D. Tabat, Matthew C. Gwinn, Robert K. Becker, Avrum Freytsis 2012-01-17
8089052 Ion source with adjustable aperture Daniel R. Tieger, William F. DiVergilio, Edward C. Eisner 2012-01-03
7750320 System and method for two-dimensional beam scan across a workpiece of an ion implanter Joseph Ferrara, Bo H. Vanderberg 2010-07-06
7701230 Method and system for ion beam profiling John Zheng Ye, Michael Cristoforo, Yongzhang Huang, Bo H. Vanderberg 2010-04-20
7598495 Methods and systems for trapping ion beam particles and focusing an ion beam Peter L. Kellerman, Victor M. Benveniste, Alexander S. Perel, Brian S. Freer 2009-10-06
7589333 Methods for rapidly switching off an ion beam Edward C. Eisner, William F. DiVergilio, Daniel R. Tieger 2009-09-15
7557363 Closed loop dose control for ion implantation Yongzhang Huang, Brian S. Freer, John Zheng Ye, Christopher Godfrey, Patrick Splinter 2009-07-07
7423277 Ion beam monitoring in an ion implanter using an imaging device Alexander S. Perel, Phil J. Ring, Ronald A. Capodilupo 2008-09-09
7375355 Ribbon beam ion implanter cluster tool Joseph Ferrara, Patrick Splinter, Victor M. Benveniste 2008-05-20
7358508 Ion implanter with contaminant collecting surface Philip J. Ring 2008-04-15
6992310 Scanning systems and methods for providing ions from an ion beam to a workpiece Joseph Ferrara, Bo H. Vanderberg 2006-01-31
6992308 Modulating ion beam current Andrew M. Ray 2006-01-31
6953942 Ion beam utilization during scanned ion implantation Andrew M. Ray 2005-10-11
6847847 Retina implant assembly and methods for manufacturing the same Wilfried Nisch, Alfred Stett, Markus Schubert, Heinz-Gerhard Graf, Hugo Hammerle +3 more 2005-01-25