AF

Avrum Freytsis

TE Tel Epion: 8 patents #7 of 54Top 15%
VA Varian: 4 patents #66 of 684Top 10%
EP Epion: 1 patents #16 of 28Top 60%
Overall (All Time): #382,585 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9343259 GCIB nozzle assembly Matthew C. Gwinn, Robert K. Becker 2016-05-17
9305746 Pre-aligned nozzle/skimmer Robert K. Becker 2016-04-05
9029808 Low contamination scanner for GCIB system Matthew C. Gwinn, Jerry Negrotti, Robert K. Becker 2015-05-12
8981322 Multiple nozzle gas cluster ion beam system Martin D. Tabat, Matthew C. Gwinn, Robert K. Becker, Michael Graf 2015-03-17
8791430 Scanner for GCIB system Matthew C. Gwinn, Jay Wallace 2014-07-29
8304033 Method of irradiating substrate with gas cluster ion beam formed from multiple gas nozzles Martin D. Tabat, Matthew C. Gwinn, Robert K. Becker, Michael Graf 2012-11-06
8097860 Multiple nozzle gas cluster ion beam processing system and method of operating Martin D. Tabat, Matthew C. Gwinn, Robert K. Becker, Michael Graf 2012-01-17
7608843 Method and apparatus for scanning a workpiece through an ion beam Matthew C. Gwinn, Eric R. Harrington 2009-10-27
6676989 Method and system for improving the effectiveness of medical stents by the application of gas cluster ion beam technology Allen R. Kirkpatrick, Robert K. Becker 2004-01-13
5350427 Wafer retaining platen having peripheral clamp and wafer lifting means Richard J. Hertel 1994-09-27
4965862 Disk scanning apparatus for batch ion implanters Judy E. Sedgewick 1990-10-23
4899059 Disk scanning apparatus for batch ion implanters Richard J. Hertel, Eric L. Mears 1990-02-06
4620738 Vacuum pick for semiconductor wafers Vladimir Schwartz 1986-11-04