JH

John Hautala

VA Varian Semiconductor Equipment Associates: 41 patents #9 of 513Top 2%
TE Tel Epion: 33 patents #1 of 54Top 2%
Applied Materials: 15 patents #903 of 7,310Top 15%
TL Tokyo Electron Limited: 7 patents #1,084 of 5,567Top 20%
EP Epion: 3 patents #8 of 28Top 30%
📍 Beverly, MA: #2 of 490 inventorsTop 1%
🗺 Massachusetts: #256 of 88,656 inventorsTop 1%
Overall (All Time): #14,620 of 4,157,543Top 1%
99
Patents All Time

Issued Patents All Time

Showing 1–25 of 99 patents

Patent #TitleCo-InventorsDate
12417923 Techniques and apparatus for selective shaping of mask features using angled beams 2025-09-16
12369299 Devices and methods for DRAM leakage reduction Armin Saeedi Vahdat, Yan Zhang, Johannes M. van Meer 2025-07-22
12255067 Method for depositing layers directly adjacent uncovered vias or contact holes Charith Nanayakkara 2025-03-18
12191156 Ribbon beam plasma enhanced chemical vapor deposition system for anisotropic deposition of thin films Tristan Y. Ma, Peter F. Kurunczi 2025-01-07
12183627 Multi process air gap formation Charith Nanayakkara 2024-12-31
12131948 Techniques for void-free material depositions M. Arif Zeeshan, Kelvin Chan, Shantanu Kallakuri, Sony Varghese 2024-10-29
12096622 Directional etch for improved dual deck three-dimensional NAND architecture margin Armin Saeedi Vahdat, Johannes M. van Meer 2024-09-17
11987879 High aspect ratio taper improvement using directional deposition Armin Saeedi Vahdat, Yan Zhang 2024-05-21
11942361 Semiconductor device cavity formation using directional deposition Armin Saeedi Vahdat, Tristan Y. Ma, Johannes M. van Meer, Naushad K. Variam 2024-03-26
11908691 Techniques to engineer nanoscale patterned features using ions Simon Ruffell, Adam Brand, Huixiong Dai 2024-02-20
11778832 Wordline contact formation in NAND devices Armin Saeedi Vahdat, Tristan Y. Ma, Johannes M. van Meer, Naushad K. Variam 2023-10-03
11749564 Techniques for void-free material depositions M. Arif Zeeshan, Kelvin Chan, Shantanu Kallakuri, Sony Varghese 2023-09-05
11574800 Extreme edge uniformity control Alexandre Likhanskii, Maureen Petterson, Anthony Renau, Christopher A. Rowland, Costel Biloiu 2023-02-07
11569095 Techniques and apparatus for selective shaping of mask features using angled beams 2023-01-31
11538925 Ion implantation to form step-oxide trench MOSFET Sipeng Gu, Yi Zheng, Qintao Zhang 2022-12-27
11488823 Techniques to engineer nanoscale patterned features using ions Simon Ruffell, Adam Brand, Huixiong Dai 2022-11-01
11404278 Optical component having variable depth gratings and method of formation Morgan Evans, Rutger Meyer Timmerman Thijssen, Joseph C. Olson 2022-08-02
11043394 Techniques and apparatus for selective shaping of mask features using angled beams 2021-06-22
11043380 Techniques to engineer nanoscale patterned features using ions Simon Ruffell, Adam Brand, Huixiong Dai 2021-06-22
10990014 Performance improvement of EUV photoresist by ion implantation Tristan Y. Ma, Huixiong Dai, Anthony Renau, Joseph C. Olson 2021-04-27
10971368 Techniques for processing substrates using directional reactive ion etching Steven R. Sherman, Simon Ruffell, Adam Brand 2021-04-06
10886279 Device structure for forming semiconductor device having angled contacts Sony Varghese, Anthony Renau, Morgan Evans, Joe Olson 2021-01-05
10818499 Optical component having variable depth gratings and method of formation Morgan Evans, Rutger Meyer Timmerman Thijssen, Joseph C. Olson 2020-10-27
10692872 Device structure for forming semiconductor device having angled contacts Sony Varghese, Anthony Renau, Morgan Evans, Joe Olson 2020-06-23
10685865 Method and device for power rail in a fin type field effect transistor Min Gyu Sung, Sony Varghese, Johannes M. van Meer 2020-06-16