JH

John Hautala

VA Varian Semiconductor Equipment Associates: 41 patents #9 of 513Top 2%
TE Tel Epion: 33 patents #1 of 54Top 2%
Applied Materials: 15 patents #903 of 7,310Top 15%
TL Tokyo Electron Limited: 7 patents #1,084 of 5,567Top 20%
EP Epion: 3 patents #8 of 28Top 30%
📍 Beverly, MA: #2 of 490 inventorsTop 1%
🗺 Massachusetts: #256 of 88,656 inventorsTop 1%
Overall (All Time): #14,620 of 4,157,543Top 1%
99
Patents All Time

Issued Patents All Time

Showing 51–75 of 99 patents

Patent #TitleCo-InventorsDate
9190498 Technique for forming a FinFET device using selective ion implantation Adam Brand, Srinivas D. Nemani, Ludovic Godet, Yuri Erokhin 2015-11-17
9118001 Techniques for treating sidewalls of patterned structures using angled ion treatment Ludovic Godet, Daniel Distaso, Christopher Campbell 2015-08-25
9103031 Method and system for growing a thin film using a gas cluster ion beam Michael Graf, Yan Shao, Brian S. Freer 2015-08-11
9082949 Magnetic memory and method of fabrication Alexander C. Kontos, Steven R. Sherman, Simon Ruffell 2015-07-14
9070854 Techniques for patterning multilayer magnetic memory devices using ion implantation 2015-06-30
8992785 Method for modifying an etch rate of a material layer using energetic charged particles 2015-03-31
8946836 Magnetic memory and method of fabrication Alexander C. Kontos, Steven R. Sherman, Simon Ruffell 2015-02-03
8877299 Method for enhancing a substrate using gas cluster ion beam processing Nathan E. Baxter, Koji Yamashita 2014-11-04
8709944 Method to alter silicide properties using GCIB treatment Noel Russell, John Gumpher 2014-04-29
8703607 Method to alter silicide properties using GCIB treatment Noel Russell, John Gumpher 2014-04-22
8697549 Deposition of porous films for thermoelectric applications Xianfeng Lu, Ludovic Godet, Christopher R. Hatem 2014-04-15
8691103 Surface profile adjustment using gas cluster ion beam processing 2014-04-08
8691700 Gas cluster ion beam etch profile control using beam divergence Michael Graf 2014-04-08
8592784 Method for modifying a material layer using gas cluster ion beam processing Nathan E. Baxter 2013-11-26
8481340 Method for preparing a light-emitting device using gas cluster ion beam processing 2013-07-09
8435890 Method to alter silicide properties using GCIB treatment Noel Russell, John Gumpher 2013-05-07
8372489 Method for directional deposition using a gas cluster ion beam 2013-02-12
8313663 Surface profile adjustment using gas cluster ion beam processing 2012-11-20
8237136 Method and system for tilting a substrate during gas cluster ion beam processing Noel Russell 2012-08-07
8226835 Ultra-thin film formation using gas cluster ion beam processing Edmund Burke, Noel Russell, Gregory Herdt 2012-07-24
8192805 Method to improve electrical leakage performance and to minimize electromigration in semiconductor devices Noel Russell, Steven R. Sherman 2012-06-05
8187971 Method to alter silicide properties using GCIB treatment Noel Russell, John Gumpher 2012-05-29
8048788 Method for treating non-planar structures using gas cluster ion beam processing Noel Russell 2011-11-01
7982196 Method for modifying a material layer using gas cluster ion beam processing Nathan E. Baxter 2011-07-19
7981483 Method to improve electrical leakage performance and to minimize electromigration in semiconductor devices Noel Russell, Steven R. Sherman 2011-07-19