KC

Kelvin Chan

Applied Materials: 66 patents #100 of 7,310Top 2%
MIT: 2 patents #2,550 of 9,367Top 30%
Rolls-Royce Plc: 2 patents #806 of 2,886Top 30%
RD Rolls-Royce Deutschland: 1 patents #254 of 638Top 40%
IN Intel: 1 patents #18,218 of 30,777Top 60%
📍 San Ramon, CA: #31 of 2,140 inventorsTop 2%
🗺 California: #4,195 of 386,348 inventorsTop 2%
Overall (All Time): #27,526 of 4,157,543Top 1%
72
Patents All Time

Issued Patents All Time

Showing 51–72 of 72 patents

Patent #TitleCo-InventorsDate
9659765 Enhancement of modulus and hardness for UV-cured ultra low-k dielectric films Kang Sub Yim, Mahendra CHHABRA, Alexandros T. Demos, Priyanka DASH 2017-05-23
9613908 Ultra-thin dielectric diffusion barrier and etch stop layer for advanced interconnect applications Deenesh Padhi, Yihong Chen, Abhijit Basu Mallick, Alexandros T. Demos, Mukund Srinivasan 2017-04-04
9508545 Selectively lateral growth of silicon oxide thin film Yihong Chen, Shaunak Mukherjee, Abhijit Basu Mallick 2016-11-29
9506145 Method and hardware for cleaning UV chambers Sanjeev Baluja, Alexandros T. Demos, Juan Carlos Rocha-Alvarez, Scott A. Hendrickson, Abhijit A. Kangude +6 more 2016-11-29
9478460 Cobalt selectivity improvement in selective cobalt process sequence Mei-Yee Shek, Weifeng YE, Li-Qun Xia, Kang Sub Yim 2016-10-25
9364871 Method and hardware for cleaning UV chambers Sanjeev Baluja, Alexandros T. Demos, Juan Carlos Rocha-Alvarez, Scott A. Hendrickson, Abhijit A. Kangude +6 more 2016-06-14
9330231 Method for determining a flow behavior of a medium Goetz G. FELDMANN 2016-05-03
9330900 Layer-by-layer deposition of carbon-doped oxide films through cyclical silylation 2016-05-03
9123532 Low-k dielectric damage repair by vapor-phase chemical exposure Alexandros T. Demos 2015-09-01
9105695 Cobalt selectivity improvement in selective cobalt process sequence Mei-Yee Shek, Weifeng YE, Li-Qun Xia, Kang Sub Yim 2015-08-11
9058980 UV-assisted photochemical vapor deposition for damaged low K films pore sealing Bo Xie, Alexandros T. Demos 2015-06-16
8993444 Method to reduce dielectric constant of a porous low-k film Jin Xu, Kang Sub Yim, Alexandros T. Demos 2015-03-31
8877659 Low-k dielectric damage repair by vapor-phase chemical exposure Alexandros T. Demos 2014-11-04
8702870 Superimposition of rapid periodic and extensive post multiple substrate UV-ozone clean sequences for high throughput and stable substrate to substrate performance Sang In Yi, Thomas Nowak, Alexandros T. Demos 2014-04-22
8492170 UV assisted silylation for recovery and pore sealing of damaged low K films Bo Xie, Alexandros T. Demos, Kang Sub Yim, Thomas Nowak 2013-07-23
8481422 Prevention and reduction of solvent and solution penetration into porous dielectrics using a thin barrier layer Khaled A. Elsheref, Alexandros T. Demos, Mei-Yee Shek, Lipan Li, Li-Qun Xia +1 more 2013-07-09
8236684 Prevention and reduction of solvent and solution penetration into porous dielectrics using a thin barrier layer Khaled A. Elsheref, Alexandros T. Demos, Meiyee Shek, Lipan Li, Li-Qun Xia +1 more 2012-08-07
7947611 Method of improving initiation layer for low-k dielectric film by digital liquid flow meter Dustin W. Ho, Juan Carlos Rocha-Alvarez, Alexandros T. Demos, Nagarajan Rajagopalan, Visweswaren Sivaramakrishnan 2011-05-24
7563734 Chemical vapor deposition of antimicrobial polymer coatings Karen K. Gleason, Tyler Martin 2009-07-21
7431969 Chemical vapor deposition of hydrogel films Karen K. Gleason 2008-10-07
7410916 Method of improving initiation layer for low-k dielectric film by digital liquid flow meter Dustin W. Ho, Juan Carlos Rocha-Alvarez, Alexandros T. Demos, Nagarajan Rajagopalan, Visweswaren Sivaramakrishnan 2008-08-12
7297376 Method to reduce gas-phase reactions in a PECVD process with silicon and organic precursors to deposit defect-free initial layers Kang Sub Yim, Nagarajan Rajagopalan, Josephine Ju-Hwei Chang Liu, Sang-Hoon Ahn, Yi Zheng +3 more 2007-11-20