TK

Tazrien Kamal

AM AMD: 24 patents #433 of 9,279Top 5%
FA Fasl: 9 patents #3 of 52Top 6%
Fujitsu Limited: 7 patents #4,529 of 24,456Top 20%
SL Spansion Llc.: 7 patents #128 of 769Top 20%
Cypress Semiconductor: 1 patents #1,072 of 1,852Top 60%
GR Georgia Tech Research: 1 patents #1,150 of 2,755Top 45%
Overall (All Time): #73,763 of 4,157,543Top 2%
42
Patents All Time

Issued Patents All Time

Showing 25 most recent of 42 patents

Patent #TitleCo-InventorsDate
9318373 Method and apparatus for protection against process-induced charging David Michael Rogers, Mimi Qian, Kwadwo Appiah, Mark Randolph, Michael VanBuskirk +3 more 2016-04-19
8673716 Memory manufacturing process with bitline isolation Mark T. Ramsbey, Jean Y. Yang, Emmanuil Lingunis, Hidehiko Shiraiwa, Yu Sun 2014-03-18
8445966 Method and apparatus for protection against process-induced charging David Michael Rogers, Mimi Qian, Kwadwo Appiah, Mark Randolph, Michael VanBuskirk +3 more 2013-05-21
7972948 Method for forming bit lines for semiconductor devices Weidong Qian, Mark T. Ramsbey 2011-07-05
7811915 Method for forming bit lines for semiconductor devices Weidong Qian, Mark T. Ramsbey 2010-10-12
7297592 Semiconductor memory with data retention liner Minh Van Ngo, Arvind Halliyal, Hidehiko Shiraiwa, Rinji Sugino, Dawn Hopper +1 more 2007-11-20
7176113 LDC implant for mirrorbit to improve Vt roll-off and form sharper junction Nga-Ching Wong, Weidong Qian, Sameer Haddad, Mark Randolph, Mark T. Ramsbey 2007-02-13
7163860 Method of formation of gate stack spacer and charge storage materials having reduced hydrogen content in charge trapping dielectric flash memory device Yun Wu, Mark T. Ramsbey, Jean Y. Yang, Arvind Halliyal, Rinji Sugino +2 more 2007-01-16
7060554 PECVD silicon-rich oxide layer for reduced UV charging Minh Van Ngo, Mark T. Ramsbey, Pei-Yuan Gao 2006-06-13
7053446 Memory wordline spacer Kashmir Sahota, Mark T. Ramsbey 2006-05-30
7033957 ONO fabrication process for increasing oxygen content at bottom oxide-substrate interface in flash memory devices Hidehiko Shiraiwa, Mark T. Ramsbey, Inkuk Kang, Jaeyong Park, Rinji Sugino +4 more 2006-04-25
7023046 Undoped oxide liner/BPSG for improved data retention Minh Van Ngo, Angela T. Hui, Ning Cheng, Jeyong Park, Jean Y. Yang +3 more 2006-04-04
7018868 Disposable hard mask for memory bitline scaling Jean Y. Yang, Jeff P. Erhardt, Cyrus E. Tabery, Weidong Qian, Mark T. Ramsbey +1 more 2006-03-28
7018896 UV-blocking layer for reducing UV-induced charging of SONOS dual-bit flash memory devices in BEOL processing Minh Van Ngo, Mark T. Ramsbey, Arvind Halliyal, Jaeyong Park, Ning Cheng +6 more 2006-03-28
6995423 Memory device having a P+ gate and thin bottom oxide and method of erasing same Wei Zheng, Chi Chang 2006-02-07
6969886 ONO fabrication process for reducing oxygen vacancy content in bottom oxide layer in flash memory devices Jaeyong Park, Hidehiko Shiraiwa, Arvind Halliyal, Jean Y. Yang, Inkuk Kang +1 more 2005-11-29
6962849 Hard mask spacer for sublithographic bitline Weidong Qian, Kouros Ghandehari, Taraneh Jamali-Beh, Mark T. Ramsbey, Ashok M. Khathuria 2005-11-08
6958511 Flash memory device and method of fabrication thereof including a bottom oxide layer with two regions with different concentrations of nitrogen Arvind Halliyal, Amir H. Jafarpour, Hidehiko Shiraiwa, Mark T. Ramsbey, Jaeyong Park 2005-10-25
6955965 Process for fabrication of nitride layer with reduced hydrogen content in ONO structure in semiconductor device Arvind Halliyal, Hidehiko Shiraiwa, Jean Y. Yang 2005-10-18
6949481 Process for fabrication of spacer layer with reduced hydrogen content in semiconductor device Arvind Halliyal, Fred Cheung, Rinji Sugino, Hidehiko Shiraiwa, Jean Y. Yang 2005-09-27
6927145 Bitline hard mask spacer flow for memory cell scaling Jean Y. Yang, Mark T. Ramsbey, Jaeyong Park, Emmanuil H. Lingunis 2005-08-09
6912163 Memory device having high work function gate and method of erasing same Wei Zheng, Yun Wu, Hidehiko Shiraiwa, Mark T. Ramsbey 2005-06-28
6884681 Method of manufacturing a semiconductor memory with deuterated materials Arvind Halliyal, Minh Van Ngo, Mark T. Ramsbey, Jean Y. Yang, Hidehiko Shiraiwa +1 more 2005-04-26
6885590 Memory device having A P+ gate and thin bottom oxide and method of erasing same Wei Zheng, Chi Chang 2005-04-26
6872609 Narrow bitline using Safier for mirrorbit Weidong Qian, Kouros Ghandehari, Taraneh Jamali-Beh 2005-03-29