AH

Arvind Halliyal

AM AMD: 66 patents #70 of 9,279Top 1%
FA Fasl: 10 patents #2 of 52Top 4%
Fujitsu Limited: 7 patents #4,529 of 24,456Top 20%
SL Spansion Llc.: 6 patents #149 of 769Top 20%
EA E.I. Du Pont De Nemours And: 1 patents #4,343 of 8,010Top 55%
Overall (All Time): #21,773 of 4,157,543Top 1%
82
Patents All Time

Issued Patents All Time

Showing 25 most recent of 82 patents

Patent #TitleCo-InventorsDate
8691647 Memory devices containing a high-K dielectric layer Wei Zheng, Mark T. Ramsbey, Jack F. Thomas 2014-04-08
8368219 Buried silicide local interconnect with sidewall spacers and method for making the same Zoran Krivokapic, Matthew S. Buynoski, Nicholas H. Tripsas, Minh Van Ngo, Mark T. Ramsbey +2 more 2013-02-05
8049334 Buried silicide local interconnect with sidewall spacers and method for making the same Zoran Krivokapic, Matthew S. Buynoski, Nicholas H. Tripsas, Minh Van Ngo, Mark T. Ramsbey +2 more 2011-11-01
7786003 Buried silicide local interconnect with sidewall spacers and method for making the same Zoran Krivokapic, Matthew S. Buynoski, Nicholas H. Tripsas, Minh Van Ngo, Mark T. Ramsbey +2 more 2010-08-31
7670936 Nitridation of gate oxide by laser processing Nicholas H. Tripsas, Mark T. Ramsbey 2010-03-02
7297592 Semiconductor memory with data retention liner Minh Van Ngo, Tazrien Kamal, Hidehiko Shiraiwa, Rinji Sugino, Dawn Hopper +1 more 2007-11-20
7163860 Method of formation of gate stack spacer and charge storage materials having reduced hydrogen content in charge trapping dielectric flash memory device Tazrien Kamal, Yun Wu, Mark T. Ramsbey, Jean Y. Yang, Rinji Sugino +2 more 2007-01-16
7115469 Integrated ONO processing for semiconductor devices using in-situ steam generation (ISSG) process Mark T. Ramsbey, Hidehiko Shiraiwa, Jean Y. Yang 2006-10-03
7079975 Scatterometry and acoustic based active control of thin film deposition process Bhanwar Singh, Ramkumar Subramanian 2006-07-18
7074677 Memory with improved charge-trapping dielectric layer Minh Van Ngo, Hidehiko Shiraiwa, Rinji Sugino 2006-07-11
7033957 ONO fabrication process for increasing oxygen content at bottom oxide-substrate interface in flash memory devices Hidehiko Shiraiwa, Tazrien Kamal, Mark T. Ramsbey, Inkuk Kang, Jaeyong Park +4 more 2006-04-25
7018896 UV-blocking layer for reducing UV-induced charging of SONOS dual-bit flash memory devices in BEOL processing Minh Van Ngo, Tazrien Kamal, Mark T. Ramsbey, Jaeyong Park, Ning Cheng +6 more 2006-03-28
7001814 Laser thermal annealing methods for flash memory devices Mark T. Ramsbey, Robert B. Ogle 2006-02-21
6992370 Memory cell structure having nitride layer with reduced charge loss and method for fabricating same George Jonathan Kluth, Robert Clark-Phelps, Joong S. Jeon, Huicai Zhong, Mark T. Ramsbey +3 more 2006-01-31
6969886 ONO fabrication process for reducing oxygen vacancy content in bottom oxide layer in flash memory devices Jaeyong Park, Hidehiko Shiraiwa, Jean Y. Yang, Inkuk Kang, Tazrien Kamal +1 more 2005-11-29
6958511 Flash memory device and method of fabrication thereof including a bottom oxide layer with two regions with different concentrations of nitrogen Amir H. Jafarpour, Hidehiko Shiraiwa, Tazrien Kamal, Mark T. Ramsbey, Jaeyong Park 2005-10-25
6955965 Process for fabrication of nitride layer with reduced hydrogen content in ONO structure in semiconductor device Tazrien Kamal, Hidehiko Shiraiwa, Jean Y. Yang 2005-10-18
6955997 Laser thermal annealing method for forming semiconductor low-k dielectric layer Minh Van Ngo 2005-10-18
6949481 Process for fabrication of spacer layer with reduced hydrogen content in semiconductor device Fred Cheung, Rinji Sugino, Hidehiko Shiraiwa, Tazrien Kamal, Jean Y. Yang 2005-09-27
6949433 Method of formation of semiconductor resistant to hot carrier injection stress Shiraiwa Hidehiko, Jaeyong Park 2005-09-27
6900121 Laser thermal annealing to eliminate oxide voiding Minh Van Ngo, Dawn Hopper 2005-05-31
6884681 Method of manufacturing a semiconductor memory with deuterated materials Tazrien Kamal, Minh Van Ngo, Mark T. Ramsbey, Jean Y. Yang, Hidehiko Shiraiwa +1 more 2005-04-26
6872643 Implant damage removal by laser thermal annealing Nicholas H. Tripsas, Mark T. Ramsbey 2005-03-29
6858496 Oxidizing pretreatment of ONO layer for flash memory Robert B. Ogle 2005-02-22
6849925 Preparation of composite high-K/standard-K dielectrics for semiconductor devices Joong S. Jeon, Minh Van Ngo, Robert B. Ogle 2005-02-01