PC

Po-Chung Cheng

TSMC: 39 patents #12 of 3,471Top 1%
📍 Dingshanjiao, TW: #1 of 9 inventorsTop 15%
Overall (2020): #500 of 565,922Top 1%
39
Patents 2020

Issued Patents 2020

Showing 26–39 of 39 patents

Patent #TitleCo-InventorsDate
10714371 Method and apparatus for lithography in semiconductor fabrication Chueh-Chi Kuo, Tsung-Yen Lee, Chia-Hsin CHOU, Tzung-Chi Fu, Li-Jui Chen +1 more 2020-07-14
10712651 Method and apparatus for collecting information used in image-error compensation Hung-Wen Cho, Fu-Jye Liang, Chun-Kuang Chen, Chih-Tsung Shih, Li-Jui Chen +1 more 2020-07-14
10687410 Extreme ultraviolet radiation source and cleaning method thereof Chi-Ming Yang, Sheng-Ta Lin, Shang-Chieh Chien, Li-Jui Chen 2020-06-16
10684561 Lithography method Hao-Yu Lan, Ching-Juinn Huang, Tzung-Chi Fu, Tsung-Yen Lee 2020-06-16
10678138 Extreme ultraviolet (EUV) radiation source and a method for generating extreme ultraviolet radiation Wei-Chun Yen, Chi-Ming Yang, Shang-Chieh Chien, Li-Jui Chen 2020-06-09
10678148 Lithography system and lithography method Kai-Chieh Chang, Tsung-Hsun Lee, Ching-Juinn Huang, Li-Jui Chen 2020-06-09
10670970 Lithography system and method thereof Wei-Shin Cheng, Hsin-Feng Chen, Cheng-Hao LAI, Shao-Hua Wang, Han-Lung Chang +1 more 2020-06-02
10663633 Aperture design and methods thereof Hung-Chih Hsieh, Kai-Chiang Wu, Yen-Liang Chen, Kai-Hsiung Chen, Chih-Ming Ke 2020-05-26
10663871 Reticle stage and method for using the same Chia-Yu Lee, Tao Chen, Chia-Hao Hsu, Ching-Juinn Huang 2020-05-26
10656539 Radiation source for lithography process Shang-Ying WU, Shang-Chieh Chien, Bo-Tsun Liu, Li-Jui Chen 2020-05-19
10642158 Method of controlling reticle masking blade positioning to minimize impact on critical dimension uniformity and device for controlling reticle masking blade positioning Hung-Wen Cho, Fu-Jye Liang, Chun-Kuang Chen, Chih-Tsung Shih, Li-Jui Chen +1 more 2020-05-05
10631392 EUV collector contamination prevention Ming-Fa Wu, Tzung-Chi Fu, Chun Che Lin, Huai-Tei Yang 2020-04-21
10624196 Laser source device and extreme ultraviolet lithography device Henry Yee Shian Tong, Wen-Chih Wang, Hsin-Liang Chen, Louis Chun-Lin Chang, Cheng-Chieh Chen +2 more 2020-04-14
10534279 Methods and apparatus for removing contamination from lithographic tool Zi-Wen Chen, Chih-Tsung Shih, Li-Jui Chen, Shih-Chang Shih 2020-01-14