NL

Nicolas Loubet

IBM: 36 patents #60 of 11,274Top 1%
SS Stmicroelectronics Sa: 6 patents #5 of 124Top 5%
CEA: 4 patents #14 of 820Top 2%
📍 Guilderland, NY: #2 of 18 inventorsTop 15%
🗺 New York: #24 of 13,306 inventorsTop 1%
Overall (2020): #455 of 565,922Top 1%
41
Patents 2020

Issued Patents 2020

Showing 1–25 of 41 patents

Patent #TitleCo-InventorsDate
10872962 Steep-switch field effect transistor with integrated bi-stable resistive system Julien Frougier, Ruilong Xie, Daniel Chanemougame, Ali Razavieh, Kangguo Cheng 2020-12-22
10854750 Semiconductor device with fin and related methods Pierre Morin 2020-12-01
10854606 Method to induce strain in finFET channels from an adjacent region Pierre Morin 2020-12-01
10847654 Method to induce strain in 3-D microfabricated structures Pierre Morin 2020-11-24
10832964 Replacement contact formation for gate contact over active region with selective metal growth Ruilong Xie, Balasubramanian Pranatharthiharan, Chanro Park 2020-11-10
10818775 Method for fabricating a field-effect transistor Shay Reboh, Emmanuel Augendre, Remi Coquand 2020-10-27
10818776 Nanosheet transistor with optimized junction and cladding detectivity control Kangguo Cheng, Ruilong Xie, Tenko Yamashita, Chun-Chen Yeh 2020-10-27
10818751 Nanosheet transistor barrier for electrically isolating the substrate from the source or drain regions Mona A. Ebrish, Fee Li Lie, Gauri Karve, Indira Seshadri, Lawrence A. Clevenger +1 more 2020-10-27
10756177 Self-limiting and confining epitaxial nucleation Robin Hsin Kuo Chao, Kangguo Cheng 2020-08-25
10756203 Sub-thermal switching slope vertical field effect transistor with dual-gate feedback loop mechanism Julien Frougier, Ruilong Xie, Steven R. Bentley, Kangguo Cheng, Pietro Montanini 2020-08-25
10756178 Self-limiting and confining epitaxial nucleation Robin Hsin Kuo Chao, Kangguo Cheng 2020-08-25
10748901 Interlayer via contacts for monolithic three-dimensional semiconductor integrated circuit devices Joshua M. Rubin, Terence B. Hook 2020-08-18
10741639 Formation of dielectric layer as etch-stop for source and drain epitaxy disconnection Robin Hsin Kuo Chao, Julien Frougier, Ruilong Xie 2020-08-11
10741675 Sub-thermal switching slope vertical field effect transistor with dual-gate feedback loop mechanism Julien Frougier, Ruilong Xie, Steven R. Bentley, Kangguo Cheng, Pietro Montanini 2020-08-11
10741660 Nanosheet single gate (SG) and extra gate (EG) field effect transistor (FET) co-integration Siva Kanakasabapathy, Kangguo Cheng, Jingyun Zhang 2020-08-11
10741641 Dielectric isolation and SiGe channel formation for integration in CMOS nanosheet channel devices Michael A. Guillorn 2020-08-11
10741454 Boundary protection for CMOS multi-threshold voltage devices Jing Guo, Ekmini Anuja De Silva, Indira Seshadri, Nelson Felix 2020-08-11
10734504 Integration of strained silicon germanium PFET device and silicon NFET device for finFET structures Bruce B. Doris, Hong He, Junli Wang 2020-08-04
10734523 Nanosheet substrate to source/drain isolation Fee Li Lie, Mona A. Ebrish, Ekmini Anuja De Silva, Indira Seshadri, Gauri Karve +2 more 2020-08-04
10727320 Method of manufacturing at least one field effect transistor having epitaxially grown electrodes Shay Reboh, Emmanuel Augendre, Remi Coquand 2020-07-28
10714392 Optimizing junctions of gate all around structures with channel pull back Emmanuel Augendre, Remi Coquand, Shay Reboh 2020-07-14
10692985 Protection of high-K dielectric during reliability anneal on nanosheet structures Sanjay C. Mehta, Vijay Narayanan, Muthumanickam Sankarapandian 2020-06-23
10665497 Method of manufacturing a structure having one or several strained semiconducting zones that may for transistor channel regions Emmanuel Augendre, Sylvain Maitrejean, Pierre Morin 2020-05-26
10658493 Gate spacer and inner spacer formation for nanosheet transistors having relatively small space between gates Zhenxing Bi, Kangguo Cheng, Xin Miao, Wenyu Xu, Chen Zhang 2020-05-19
10644110 Co-integration of elastic and plastic relaxation on the same wafer Stephen W. Bedell, Devendra K. Sadana 2020-05-05