AK

Ali Khakifirooz

IBM: 116 patents #4 of 10,295Top 1%
Globalfoundries: 83 patents #3 of 2,145Top 1%
RE Renesas Electronics: 2 patents #126 of 914Top 15%
CEA: 1 patents #246 of 991Top 25%
IB International Business: 1 patents #1 of 8Top 15%
SS Stmicroelectronics Sa: 1 patents #64 of 162Top 40%
📍 Brookline, MA: #1 of 399 inventorsTop 1%
🗺 Massachusetts: #1 of 12,163 inventorsTop 1%
Overall (2016): #16 of 481,213Top 1%
185
Patents 2016

Issued Patents 2016

Showing 51–75 of 185 patents

Patent #TitleCo-InventorsDate
9431265 Fin cut for tight fin pitch by two different sit hard mask materials on fin Kangguo Cheng, Alexander Reznicek, Tenko Yamashita 2016-08-30
9431306 Methods of forming fin isolation regions on FinFET semiconductor devices using an oxidation-blocking layer of material and by performing a fin-trimming process Ajey Poovannummoottil Jacob, Bruce B. Doris, Kangguo Cheng, Kern Rim 2016-08-30
9425319 Integrated circuits including FINFET devices with lower contact resistance and reduced parasitic capacitance and methods for fabricating the same Xiuyu Cai, Ruilong Xie, Kangguo Cheng 2016-08-23
9425080 Non-volatile memory device employing semiconductor nanoparticles Kangguo Cheng, Robert H. Dennard, Hemanth Jagannathan, Tak H. Ning, Ghavam G. Shahidi 2016-08-23
9418841 Type III-V and type IV semiconductor device formation Kangguo Cheng, Bruce B. Doris, Pouya Hashemi, Alexander Reznicek 2016-08-16
9419074 Non-planar semiconductor device with aspect ratio trapping Kangguo Cheng, Pouya Hashemi, Alexander Reznicek 2016-08-16
9419078 Floating body memory with asymmetric channel Kangguo Cheng, Bruce B. Doris, Alexander Reznicek 2016-08-16
9412740 Integrated circuit product with a gate height registration structure Ruilong Xie, Michael Wedlake, Xiuyu Cai, Kangguo Cheng 2016-08-09
9412822 Methods of forming stressed channel regions for a FinFET semiconductor device and the resulting device Xiuyu Cai, Ruilong Xie, Kangguo Cheng, Ajey Poovannummoottil Jacob, Witold P. Maszara 2016-08-09
9406545 Bulk semiconductor fins with self-aligned shallow trench isolation structures Thomas N. Adam, Kangguo Cheng, Alexander Reznicek 2016-08-02
9406682 Method and structure for preventing epi merging in embedded dynamic random access memory Veeraraghavan S. Basker, Kangguo Cheng 2016-08-02
9406529 Formation of FinFET junction Kevin K. Chan, Pouya Hashemi, John A. Ott, Alexander Reznicek 2016-08-02
9406506 Lattice matched aspect ratio trapping to reduce defects in III-V layer directly grown on silicon Keith E. Fogel, Pouya Hashemi, Alexander Reznicek 2016-08-02
9401373 Multi-fin finFETs with merged-fin source/drains and replacement gates Thomas N. Adam, Kangguo Cheng, Alexander Reznicek 2016-07-26
9401311 Self aligned structure and method for high-K metal gate work function tuning Kangguo Cheng, Bruce B. Doris, Alexander Reznicek 2016-07-26
9401334 Preventing unauthorized use of integrated circuits for radiation-hard applications Kangguo Cheng, Bruce B. Doris, Kenneth P. Rodbell 2016-07-26
9401372 Dual isolation on SSOI wafer Bruce B. Doris, Hong He, Junli Wang 2016-07-26
9397094 Semiconductor structure with an L-shaped bottom plate Kangguo Cheng, Wilfried E. Haensch, Davood Shahrjerdi 2016-07-19
9391091 MOSFET with work function adjusted metal backgate Kangguo Cheng, Bruce B. Doris, Pranita Kerber 2016-07-12
9391077 SiGe and Si FinFET structures and methods for making the same Kangguo Cheng, Bruce B. Doris, Pouya Hashemi, Alexander Reznicek 2016-07-12
9390925 Silicon—germanium (SiGe) fin formation Kangguo Cheng, Alexander Reznicek, Dominic J. Schepis 2016-07-12
9390939 Methods of forming MIS contact structures for semiconductor devices and the resulting devices Ruilong Xie, Xiuyu Cai, Kangguo Cheng 2016-07-12
9391069 MIM capacitor with enhanced capacitance formed by selective epitaxy Kangguo Cheng, Bruce B. Doris, Pouya Hashemi, Alexander Reznicek, Raghavasimhan Sreenivasan 2016-07-12
9385023 Method and structure to make fins with different fin heights and no topography Kangguo Cheng, Joel P. de Souza, Alexander Reznicek, Dominic J. Schepis 2016-07-05
9385231 Device structure with increased contact area and reduced gate capacitance Thomas N. Adam, Kangguo Cheng, Alexander Reznicek 2016-07-05