AJ

Ajey Poovannummoottil Jacob

Globalfoundries: 39 patents #7 of 2,145Top 1%
IBM: 7 patents #605 of 10,295Top 6%
SS Stmicroelectronics Sa: 5 patents #13 of 162Top 9%
RE Renesas Electronics: 2 patents #126 of 914Top 15%
CEA: 2 patents #97 of 991Top 10%
University of California: 1 patents #239 of 1,590Top 20%
IN Intel: 1 patents #2,105 of 5,207Top 45%
📍 Los Angeles, CA: #1 of 1,225 inventorsTop 1%
🗺 California: #71 of 57,791 inventorsTop 1%
Overall (2016): #287 of 481,213Top 1%
40
Patents 2016

Issued Patents 2016

Showing 1–25 of 40 patents

Patent #TitleCo-InventorsDate
9524908 Methods of removing portions of fins by preforming a selectively etchable material in the substrate Yi Qi 2016-12-20
9508853 Channel cladding last process flow for forming a channel region on a FinFET device having a reduced size fin in the channel region Witold P. Maszara, Jody A. Fronheiser 2016-11-29
9496354 Semiconductor devices with dummy gate structures partially on isolation regions Ruilong Xie, Xiuyu Cai, Andreas Knorr, Christopher M. Prindle 2016-11-15
9484428 Non-planar exciton transistor (BiSFET) and methods for making 2016-11-01
9478663 FinFET device including a uniform silicon alloy fin Jody A. Fronheiser, Yi Qi, Sylvie Mignot 2016-10-25
9466664 Uniaxially-strained FD-SOI finFET Pierre Morin, Maud Vinet, Laurent Grenouillet 2016-10-11
9455199 Methods of forming strained and relaxed germanium fins for PMOS and NMOS finFET devices, respectively 2016-09-27
9455140 Methods of forming doped epitaxial SiGe material on semiconductor devices Jody A. Fronheiser, Murat Kerem Akarvardar 2016-09-27
9431306 Methods of forming fin isolation regions on FinFET semiconductor devices using an oxidation-blocking layer of material and by performing a fin-trimming process Bruce B. Doris, Kangguo Cheng, Ali Khakifirooz, Kern Rim 2016-08-30
9425315 FinFET semiconductor device with isolated fins made of alternative channel materials Murat Kerem Akarvardar 2016-08-23
9425289 Methods of forming alternative channel materials on FinFET semiconductor devices Murat Kerem Akarvardar 2016-08-23
9412822 Methods of forming stressed channel regions for a FinFET semiconductor device and the resulting device Xiuyu Cai, Ruilong Xie, Kangguo Cheng, Ali Khakifirooz, Witold P. Maszara 2016-08-09
9406803 FinFET device including a uniform silicon alloy fin Jody A. Fronheiser, Murat Kerem Akarvardar, Steven Bentley 2016-08-02
9385233 Bulk finFET with partial dielectric isolation featuring a punch-through stopping layer under the oxide Murat Kerem Akarvardar 2016-07-05
9373721 Methods of forming a non-planar ultra-thin body semiconductor device and the resulting devices Ruilong Xie, Michael Hargrove 2016-06-21
9368591 Transistors comprising doped region-gap-doped region structures and methods of fabrication Steven Bentley, Chia-Yu Chen, Tenko Yamashita 2016-06-14
9368578 Methods of forming substrates comprised of different semiconductor materials and the resulting device Bartlomiej Jan Pawlak, Steven Bentley 2016-06-14
9362405 Channel cladding last process flow for forming a channel region on a FinFET device Witold P. Maszara, Jody A. Fronheiser 2016-06-07
9362277 FinFET with multilayer fins for multi-value logic (MVL) applications and method of forming Min-hwa Chi, Abhijeet Paul 2016-06-07
9349840 Methods of forming stressed channel regions for a FinFET semiconductor device and the resulting device Xiuyu Cai, Ruilong Xie, Witold P. Maszara, Kangguo Cheng, Ali Khakifirooz 2016-05-24
9349658 Methods of forming fin isolation regions on finFET semiconductor devices using an oxidation-blocking layer of material Bruce B. Doris, Kangguo Cheng, Ali Khakifirooz, Kern Rim 2016-05-24
9349730 Fin transformation process and isolation structures facilitating different Fin isolation schemes Kangguo Cheng, Bruce B. Doris, Nicolas Loubet, Prasanna Khare, Ramachandra Divakaruni 2016-05-24
9343300 Methods of forming source/drain regions for a PMOS transistor device with a germanium-containing channel region Michael Hargrove, Jody A. Fronheiser, Murat Kerem Akarvardar 2016-05-17
9324790 Self-aligned dual-height isolation for bulk FinFET Murat Kerem Akarvardar, Steven Bentley, Kangguo Cheng, Bruce B. Doris, Jody A. Fronheiser +2 more 2016-04-26
9318552 Methods of forming conductive contact structures for a semiconductor device with a larger metal silicide contact area and the resulting devices Ruilong Xie, William J. Taylor, Jr. 2016-04-19