NL

Nicolas Loubet

SS Stmicroelectronics Sa: 22 patents #2 of 162Top 2%
IBM: 9 patents #421 of 10,295Top 5%
CEA: 6 patents #8 of 991Top 1%
Globalfoundries: 2 patents #439 of 2,145Top 25%
📍 Guilderland, NY: #1 of 18 inventorsTop 6%
🗺 New York: #60 of 11,723 inventorsTop 1%
Overall (2016): #909 of 481,213Top 1%
24
Patents 2016

Issued Patents 2016

Showing 1–24 of 24 patents

Patent #TitleCo-InventorsDate
9530777 FinFETs of different compositions formed on a same substrate Hong He, James Kuss 2016-12-27
9520393 Fully substrate-isolated FinFET transistor Prasanna Khare 2016-12-13
9502292 Dual shallow trench isolation liner for preventing electrical shorts Bruce B. Doris, Shom Ponoth, Prasanna Khare, Qing Liu, Maud Vinet 2016-11-22
9466720 Method of making a CMOS semiconductor device using a stressed silicon-on-insulator (SOI) wafer Qing Liu 2016-10-11
9466718 Semiconductor device with fin and related methods Pierre Morin 2016-10-11
9460971 Method to co-integrate oppositely strained semiconductor devices on a same substrate Sylvain Maitrejean, Romain Wacquez 2016-10-04
9461174 Method for the formation of silicon and silicon-germanium fin structures for FinFET devices Hong He, James Kuss 2016-10-04
9437504 Method for the formation of fin structures for FinFET devices Prasanna Khare, Qing Liu, Balasubramanian Pranatharthiharan, Shom Ponoth 2016-09-06
9437474 Method for fabricating microelectronic devices with isolation trenches partially formed under active regions Laurent Grenouillet, Yannick Le Tiec, Maud Vinet, Romain Wacquez 2016-09-06
9419111 Multi-fin FINFET device including epitaxial growth barrier on outside surfaces of outermost fins and related methods Qing Liu, Prasanna Khare 2016-08-16
9418900 Silicon germanium and silicon fins on oxide from bulk wafer Hong He, James Kuss, Junli Wang 2016-08-16
9406783 Method to induce strain in finFET channels from an adjacent region Pierre Morin 2016-08-02
9396984 Method of producing a microelectronic device in a monocrystalline semiconductor substrate with isolation trenches partially formed under an active region Maud Vinet, Romain Wacquez 2016-07-19
9385051 Method for the formation of a FinFET device having partially dielectric isolated fin structure Ronald K. Sampson 2016-07-05
9368411 Method for the formation of fin structures for FinFET devices Qing Liu 2016-06-14
9349730 Fin transformation process and isolation structures facilitating different Fin isolation schemes Ajey Poovannummoottil Jacob, Kangguo Cheng, Bruce B. Doris, Prasanna Khare, Ramachandra Divakaruni 2016-05-24
9337079 Prevention of contact to substrate shorts Qing Liu, Shom Ponoth 2016-05-10
9263343 Dual EPI CMOS integration for planar substrates Balasubramanian Pranatharthiharan 2016-02-16
9263580 Methods of forming isolated channel regions for a FinFET semiconductor device and the resulting device Ajey Poovannummoottil Jacob 2016-02-16
9257450 Semiconductor device including groups of stacked nanowires and related methods James Kuss 2016-02-09
9252052 Dual shallow trench isolation liner for preventing electrical shorts Bruce B. Doris, Shom Ponoth, Prasanna Khare, Qing Liu, Maud Vinet 2016-02-02
9245953 Method to induce strain in 3-D microfabricated structures Pierre Morin 2016-01-26
9236380 Semiconductor-on-insulator (SOI) device and related methods for making same using non-oxidizing thermal treatment Pierre Morin, Qing Liu 2016-01-12
9230991 Method to co-integrate oppositely strained semiconductor devices on a same substrate Sylvain Maitrejean, Romain Wacquez 2016-01-05