PT

Philip J. Tobin

Motorola: 42 patents #55 of 12,470Top 1%
FS Freeescale Semiconductor: 10 patents #296 of 3,767Top 8%
📍 Scottsdale, AZ: #42 of 3,386 inventorsTop 2%
🗺 Arizona: #412 of 32,909 inventorsTop 2%
Overall (All Time): #51,219 of 4,157,543Top 2%
52
Patents All Time

Issued Patents All Time

Showing 1–25 of 52 patents

Patent #TitleCo-InventorsDate
8178401 Method for fabricating dual-metal gate device David C. Gilmer, Srikanth B. Samavedam 2012-05-15
7868389 Electronic device comprising a gate electrode including a metal-containing layer having one or more impurities Olubunmi O. Adetutu, David C. Gilmer 2011-01-11
7655550 Method of making metal gate transistors James K. Schaeffer, David C. Gilmer, Mark V. Raymond, Srikanth B. Samavedam 2010-02-02
7432164 Semiconductor device comprising a transistor having a counter-doped channel region and method for forming the same Olubunmi O. Adetutu, David C. Gilmer 2008-10-07
7297588 Electronic device comprising a gate electrode including a metal-containing layer having one or more impurities and a process for forming the same Olubunmi O. Adetutu, David C. Gilmer 2007-11-20
7091568 Electronic device including dielectric layer, and a process for forming the electronic device Rama I. Hegde, Alexander Demkov, Dina H. Triyoso 2006-08-15
7029980 Method of manufacturing SOI template layer Chun-Li Liu, Marius Orlowski, Matthew W. Stoker, Mariam Sadaka, Alexander L. Barr +4 more 2006-04-18
7015153 Method for forming a layer using a purging gas in a semiconductor process Dina H. Triyoso, Olubunmi O. Adetutu, David C. Gilmer, Darrell Roan, James K. Schaeffer +1 more 2006-03-21
6972224 Method for fabricating dual-metal gate device David C. Gilmer, Srikanth B. Samavedam 2005-12-06
6894353 Capped dual metal gate transistors for CMOS process and method for making the same Srikanth B. Samavedam 2005-05-17
6818493 Selective metal oxide removal performed in a reaction chamber in the absence of RF activation Christopher C. Hobbs 2004-11-16
6717226 Transistor with layered high-K gate dielectric and method therefor Rama I. Hegde, Joe Mogab, Hsing-Huang Tseng, Chun-Li Liu, Leonard Borucki +3 more 2004-04-06
6432779 Selective removal of a metal oxide dielectric Christopher C. Hobbs, Rama I. Hegde 2002-08-13
6423632 Semiconductor device and a process for forming the same Srikanth B. Samavedam, William J. Taylor, Jr. 2002-07-23
6383873 Process for forming a structure Rama I. Hegde, Amit Sureshkumar Nangia 2002-05-07
6376349 Process for forming a semiconductor device and a conductive structure Olubunmi O. Adetutu, Bikas Maiti 2002-04-23
6362071 Method for forming a semiconductor device with an opening in a dielectric layer Bich-Yen Nguyen, William J. Taylor, Jr., David L. O'Meara, Percy V. Gilbert, Yeong-Jyh T. Lii +1 more 2002-03-26
6297173 Process for forming a semiconductor device Rama I. Hegde, Hsing-Huang Tseng, David L. O'Meara, Victor Wang 2001-10-02
6255204 Method for forming a semiconductor device Olubunmi O. Adetutu, Rama I. Hegde, Bikas Maiti 2001-07-03
6136682 Method for forming a conductive structure having a composite or amorphous barrier layer Rama I. Hegde, Dean J. Denning, Jeffrey L. Klein 2000-10-24
6084279 Semiconductor device having a metal containing layer overlying a gate dielectric Bich-Yen Nguyen, J. Olufemi Olowolafe, Bikas Maiti, Olubunmi O. Adetutu 2000-07-04
6063698 Method for manufacturing a high dielectric constant gate oxide for use in semiconductor integrated circuits Hsing-Huang Tseng 2000-05-16
6027961 CMOS semiconductor devices and method of formation Bikas Maiti, C. Joseph Mogab, Christopher C. Hobbs, Larry E. Frisa 2000-02-22
6020024 Method for forming high dielectric constant metal oxides Bikas Maiti, Rama I. Hegde, Jesus Cuellar 2000-02-01
5972804 Process for forming a semiconductor device Rama I. Hegde, Hsing-Huang Tseng, David L. O'Meara, Victor Wang 1999-10-26