RH

Rama I. Hegde

Motorola: 12 patents #718 of 12,470Top 6%
FS Freeescale Semiconductor: 10 patents #296 of 3,767Top 8%
NU Nxp Usa: 7 patents #235 of 2,066Top 15%
🗺 Texas: #4,073 of 125,132 inventorsTop 4%
Overall (All Time): #131,305 of 4,157,543Top 4%
29
Patents All Time

Issued Patents All Time

Showing 1–25 of 29 patents

Patent #TitleCo-InventorsDate
10763115 Substrate treatment method for semiconductor device fabrication 2020-09-01
10367071 Method and structure for a large-grain high-k dielectric 2019-07-30
10217698 Die attachment for packaged semiconductor device Akhilesh Kumar Singh, Nishant Lakhera 2019-02-26
10147697 Bond pad structure for semiconductor device packaging Varughese Mathew 2018-12-04
10121652 Formation of metal oxide layer 2018-11-06
9590063 Method and structure for a large-grain high-K dielectric 2017-03-07
9559077 Die attachment for packaged semiconductor device Akhilesh Kumar Singh, Nishant Lakhera 2017-01-31
9343422 Structure for aluminum pad metal under ball bond 2016-05-17
9337164 Coating layer for a conductive structure 2016-05-10
9076783 Methods and systems for selectively forming metal layers on lead frames after die attachment 2015-07-07
8921176 Modified high-K gate dielectric stack 2014-12-30
8637393 Methods and structures for capping a structure with a protective coating 2014-01-28
8440507 Lead frame sulfur removal 2013-05-14
8313947 Method for testing a contact structure 2012-11-20
7445976 Method of forming a semiconductor device having an interlayer and structure therefor James K. Schaeffer, Srikanth B. Samavedam 2008-11-04
7439105 Metal gate with zirconium 2008-10-21
7091568 Electronic device including dielectric layer, and a process for forming the electronic device Alexander Demkov, Philip J. Tobin, Dina H. Triyoso 2006-08-15
6717226 Transistor with layered high-K gate dielectric and method therefor Joe Mogab, Philip J. Tobin, Hsing-Huang Tseng, Chun-Li Liu, Leonard Borucki +3 more 2004-04-06
6432779 Selective removal of a metal oxide dielectric Christopher C. Hobbs, Philip J. Tobin 2002-08-13
6383873 Process for forming a structure Philip J. Tobin, Amit Sureshkumar Nangia 2002-05-07
6300202 Selective removal of a metal oxide dielectric Christopher C. Hobbs, Phillip J. Tobin 2001-10-09
6297173 Process for forming a semiconductor device Philip J. Tobin, Hsing-Huang Tseng, David L. O'Meara, Victor Wang 2001-10-02
6255204 Method for forming a semiconductor device Philip J. Tobin, Olubunmi O. Adetutu, Bikas Maiti 2001-07-03
6187682 Inert plasma gas surface cleaning process performed insitu with physical vapor deposition (PVD) of a layer of material Dean J. Denning, Sam S. Garcia, Robert W. Fiordalice 2001-02-13
6136682 Method for forming a conductive structure having a composite or amorphous barrier layer Dean J. Denning, Jeffrey L. Klein, Philip J. Tobin 2000-10-24